IEEE 2671-2022
$48.75
IEEE Standard for General Requirements of Online Detection Based on Machine Vision in Intelligent Manufacturing (Published)
Published By | Publication Date | Number of Pages |
IEEE | 2022 |
New IEEE Standard – Active. General requirements of online detection based on machine vision, including requirements for data format, data transmission processes, definition of application scenarios and performance metrics for evaluating the effect of online detection deployment are specified in this standard.
PDF Catalog
PDF Pages | PDF Title |
---|---|
1 | IEEE Std 2671-2022 Front cover |
2 | Title page |
4 | Important Notices and Disclaimers Concerning IEEE Standards Documents |
8 | Participants |
10 | Introduction |
11 | Contents |
13 | List of Figures |
15 | List of Tables |
16 | 1. Overview 1.1 Scope 1.2 Purpose 1.3 Word usage |
17 | 2. Normative references 3. Definitions, acronyms, and abbreviations 3.1 Definitions 3.2 Acronyms and abbreviations |
18 | 4. Generic flows and architecture 4.1 Generic flows and generic architecture |
20 | 4.2 Scenario and defect modes 5. Input 5.1 Requirements for image acquisition |
21 | 5.2 Setup |
22 | 5.3 Lighting 5.4 Camera 5.5 Other features |
23 | 6. Process 6.1 Requirements of vision-based processing |
24 | 6.2 Features 7. Output 7.1 Output requirements |
25 | 7.2 Output data, output file, and output form 7.3 System interface standards 7.4 Output storage methods 8. Function requirements 8.1 General |
26 | 8.2 Operation mode switching function |
27 | 8.3 Configuration management function 8.4 Self-diagnostic function 8.5 Remote system maintenance function 8.6 Report function 8.7 Control function |
28 | 8.8 Security and safety function 8.9 System reset function 9. Interoperability Requirements 9.1 Scenario |
29 | 9.2 Interoperability requirement 9.3 Communication protocol |
30 | 9.4 Communication interface 9.5 Data access 9.6 System management function |
32 | 10. Performance 10.1 Comprehensive performance |
33 | 10.2 Equipment performance 10.3 Process performance |
34 | 10.4 Manufacturing management performance 11. Test methodology 11.1 General |
35 | 11.2 Industrial scene survey 11.3 Demand to sort out 11.4 Testing preparation 11.5 Select the test case 11.6 Select industry comparison samples 11.7 Test suite simulation |
36 | 11.8 Output test results |
37 | Annex A (informative) Integrated circuit (IC) substrate inspection A.1 Overview |
38 | A.2 Detailed introduction |
42 | A.3 Analysis |
43 | Annex B (normative) Thermal grease online detection B.1 Overview |
44 | B.2 Detailed introduction |
47 | B.3 Analysis |
48 | Annex C (informative) Machine vision in process control of IC manufacturing C.1 Overview |
49 | C.2 Detailed introduction |
52 | C.3 Analysis |
53 | Annex D (informative) Online detection on semiconductor package D.1 Overview |
54 | D.2 Detailed introduction |
59 | D.3 Analysis |
60 | Annex E (informative) Defect detection of magnetic tiles based on machine vision E.1 Overview |
62 | E.2 Detailed introduction |
64 | E.3 Analysis |
65 | Back cover |