IEEE C62.45 2003

$60.13

IEEE Recommended Practice on Surge Testing for Equipment Connected to Low-Voltage (1000 V and less) AC Power Circuits

Published By	Publication Date	Number of Pages
IEEE	2003	94

Guaranteed Safe Checkout

Category: IEEE

If you have any questions, feel free to reach out to our online customer service team by clicking on the bottom right corner. We’re here to assist you 24/7.
Email:[email protected]

Description

Revision Standard – Active. The scope of this recommended practice is the performance of surge testing on electrical and electronic equipment connected to low-voltage ac power circuits, specifically using there commended test waveforms defined in IEEE Std C62.41.2TM-2002. Nevertheless, these recommendations are applicable to any surge testing, regardless of the specific surges that may be applied. This IEEE standards product is part C62 Family on Surge Protection.

PDF Catalog

PDF Pages	PDF Title
1	IEEE Std C62.45-2002 Cover Page
2	Title Page
3	Abstract/Keywords
5	Introduction CAUTION Participants
8	CONTENTS
10	1. Overview 1.1 Scope
11	1.2 Purpose
12	2. References
13	3. Definitions 3.1 Technical terms 3.2 Special word usage
14	4. Planning of surge testing: Basic objectives 4.1 General 4.2 Surge environment
15	4.3 Types of tests 4.4 Results and consequences of the test
16	4.5 Unpowered testing versus powered testing
17	4.6 Withstand levels 4.7 Voltage and current waveforms
19	4.8 Safety 5. Implementation of surge testing: Test equipment 5.1 General 5.2 Surge generators
20	5.3 Point of test surge application 5.4 Coupling the surge to the EUT
22	5.5 Monitoring the EUT
24	6. Performance of surge testing: Test procedures 6.1 General 6.2 Limiting stresses 6.3 Nature of the EUT
25	6.4 Safety
26	7. Applying the test surge: Coupling and decoupling circuits 7.1 General 7.2 Requirements for surge coupling
28	7.3 Impedance considerations 7.4 Requirements for surge decoupling
29	7.5 Surge coupling
33	8. Grounding 8.1 Grounding precautions
35	8.2 Grounding practices in EUTs 9. Standard surge tests waveforms 9.1 General
36	9.2 Standard waveforms
40	9.3 Test procedures
41	9.4 Equations for standard waveforms
43	10. Additional surge test waveforms 10.1 General 10.2 Additional waveforms
49	10.3 Equations for additional waveforms 11. Evaluating test results
51	Annex A (informative) SPD Class I test parameters A.1 General A.2 The IEC Class I test for SPDs A.3 Parameters for a 10/350 µs waveform
53	Annex B (informative) Complementary notes B.1 AC power interface (ac power port)
54	B.2 Average power (overstressing) B.3 Back filter B.4 Blind spots
55	B.5 Common mode (and normal mode)
57	B.6 Communications interface (control/signal port)
58	B.7 Coupler B.8 Coupling gap B.9 Current surging
59	B.10 Current transformers
60	B.11 Damage B.12 Design test
61	B.13 Diagnostic test B.14 Differential connection
62	B.15 Effective output impedance
64	B.16 Environment test versus component specification test
65	B.17 Equipment grounding conductor
66	B.18 Equipment under test (EUT) B.19 Fault current
68	B.20 Follow current B.21 Ground fault protection
69	B.22 Grounding conductor B.23 Grounding practices
70	B.24 Insulation coordination
72	B.25 Insulation degradation B.26 Insulation tracking B.27 Life consumption
73	B.28 Low voltage B.29 Monitoring B.30 Multiple surge
74	B.31 Noise B.32 Normal mode B.33 Partial discharge B.34 Phase angle
75	B.35 Powered testing
76	B.36 Production test B.37 Qualification test B.38 Repetition rate
77	B.39 Surge coupling
78	B.40 Surge event B.41 Surge let-through
79	B.42 Surge remnant B.43 Susceptibility B.44 Test conditions
81	B.45 Unforeseen consequences B.46 Unpowered testing B.47 Upset
82	B.48 Vulnerability B.49 Waveform: Voltage versus current
84	B.50 Withstand level
85	Annex C (informative) Practical hints on surge testing C.1 Surge measurements
90	C.2 Point of surge application and measurement C.3 Trial run on components
91	C.4 Cheesecloth specifications C.5 Smoke, sights, and sounds C.6 Does it make sense?
93	Annex D (informative) Bibliography

Additional information

Standard Title	IEEE Recommended Practice on Surge Testing for Equipment Connected to Low-Voltage (1000 V and less) AC Power Circuits
Published Code	IEEE
Publication Date	2003
Pages Count	94

Preview PDF


PDF Format	Searchable	Printable	Preview Now

IEEE C62.45 2003

PDF Catalog

Related products