ISO 17867:2015

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Particle size analysis — Small-angle X-ray scattering

Published By	Publication Date	Number of Pages
ISO	2015-05	30

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Categories: 19.120 - Particle size analysis. Sieving, ISO

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Description

Small-angle X-ray scattering (SAXS) is a well-established technique that allows structural information to be obtained about inhomogeneities in materials with a characteristic length from 1 nm to 100 nm. Under certain conditions (narrow size distributions, appropriate instrumental configuration, and idealised shape) the limit of 100 nm can be significantly extended. ISO 17687:2015 specifies a method for the application of SAXS to the estimation of mean particle sizes in dilute dispersions where the interaction between the particles is negligible. This International Standard allows two complementary data evaluation methods to be performed, model fitting and Guinier approximation. The most appropriate evaluation method shall be selected by the analyst and stated clearly in the report. SAXS is sensitive to electron density fluctuations. Therefore, particles in solution and pores in a matrix can be studied in same way.

Additional information

Published Code	ISO
Published By	International Organization for Standardization
Publication Date	2015-05
Pages Count	30
Language	English
Edition	1
File Size	931.8 KB
ICS Codes	19.120 - Particle size analysis. Sieving

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ISO 17867:2015

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