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ISO 23170:2022

$39.00

Surface chemical analysis — Depth profiling — Non-destructive depth profiling of nanoscale heavy metal oxide thin films on Si substrates with medium energy ion scattering

Published By Publication Date Number of Pages
ISO 2022-06 36
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This document specifies a method for the quantitative depth profiling of amorphous heavy metal oxide ultrathin films on Si substrates using medium energy ion scattering (MEIS).

ISO 23170:2022
$39.00