31.080.01 - Semiconductor devices in general
Showing 17–32 of 525 results
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IEC 62483:2013
Environmental acceptance requirements for tin whisker susceptibility of tin and tin alloy surface finishes on…
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IEC 62418:2010
Dispositifs à semi-conducteurs – Essai sur les cavités dues aux contraintes de la métallisation Published…
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IEC 62415:2010
Semiconductor devices – Constant current electromigration test Published By Publication Date Number of Pages IEC…
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IEC 62007-1:2015
Semiconductor optoelectronic devices for fibre optic system applications – Part 1: Specification template for essential…
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IEC 62007-1:2008
Semiconductor optoelectronic devices for fibre optic system applications – Part 1: Specification template for essential…
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IEC 61975:2010
High-voltage direct current (HVDC) installations – System tests Published By Publication Date Number of Pages…
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IEC 60822:1988
VSB – Parallel Sub-system Bus of the IEC 60821 VMEbus Published By Publication Date Number…
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IEC 60821:1991/AMD1:1999
Amendment 1 – VMEbus – Microprocessor system bus for 1 byte to 4 byte data…
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IEC 60821:1991
VMEbus – Microprocessor system bus for 1 byte to 4 byte data Published By Publication…
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IEC 60796-3:1990
Microprocessor system bus – 8-bit and 16-bit data (MULTIBUS I) – Part 3: Mechanical and…
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IEC 60796-2:1990
Bus système à microprocesseur. Données : 8 bits et 16 bits (multi bus 1). Deuxième…
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IEC 60796-1:1990
Bus système à microprocesseurs. Données : 8 bits et 16 bits (multi bus 1). Première…
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IEC 60749-9:2017
Dispositifs à semiconducteurs – Méthodes d’essais mécaniques et climatiques – Partie 9: Permanence du marquage…
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IEC 60749-9:2002
Semiconductor devices – Mechanical and climatic test methods – Part 9: Permanence of marking Published…
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IEC 60749-8:2002
Dispositifs à semiconducteurs – Méthodes d’essais mécaniques et climatiques – Partie 8 : étanchéité Published…
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IEC 60749-7:2011
Semiconductor devices – Mechanical and climatic test methods – Part 7: Internal moisture content measurement…