31.080.30 - Transistors
Showing 33–48 of 90 results
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UNE-EN 120003:1992:1996 Edition
BDS: phototransistors, photodarlington transistors, phototransistor arrays. Published By Publication Date Number of Pages AENOR 1996-09-01…
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BS IEC 62899-503-3:2021
Printed electronics – Quality assessment. Measuring method of contact resistance for the printed thin film…
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BS IEC 60747-7:2010+A1:2019
Semiconductor devices. Discrete devices – Bipolar transistors Published By Publication Date Number of Pages BSI…
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BS EN 62417:2010
Semiconductor devices. Mobile ion tests for metal-oxide semiconductor field effect transistors (MOSFETs) Published By Publication…
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BS EN 62416:2010
Semiconductor devices. Hot carrier test on MOS transistors Published By Publication Date Number of Pages…
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BS IEC 63284:2022
Semiconductor devices. Reliability test method by inductive load switching for gallium nitride transistors Published By…
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BS IEC 63275-1:2022
Semiconductor devices. Reliability test method for silicon carbide discrete metal-oxide semiconductor field effect transistors –…
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BS IEC 62899-503-3:2021
Printed electronics – Quality assessment. Measuring method of contact resistance for the printed thin film…
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BS IEC 60747-8:2010+A1:2021
Semiconductor devices. Discrete devices – Field-effect transistors Published By Publication Date Number of Pages BSI…
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ASTM-F1340:1992 Edition
F1340-92 Test Method for Determining the Mean Interface Trap Density of Mosfets by Charge-Pumping (Withdrawn…
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ASTM-F1096:1987 Edition
F1096-87 Method for Measuring Mosfet Saturated Threshold Voltage (Withdrawn 1992) Published By Publication Date Number…
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ASTM-F632 1990
F632-90 Test Method for Measuring Small-Signal Comon Emitter Current Gain of Transistors at High Frequencies…
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ASTM-F466 1992
F466-79(1992) Test Method for Small-Signal Scattering Parameters of Low-Power Transistors in the 0.2 to 2.0…
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BS 9352:1980
Rules for the preparation of detail specifications for semiconductor devices of assessed quality: field effect…
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BS 9300 C588:1971
Detail specification for silicon n-p-n high frequency planar transistor Published By Publication Date Number of…
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BSI 19/30389766 DC:2019 Edition
BS IEC 60747-8 AMD1. Semiconductor devices. Discrete devices – Part 8. Field-effect transistors Published By…