31.080 - Semiconductor devices
Showing 1105–1120 of 1120 results
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ASTM-E722 2009
E722-09 Standard Practice for Characterizing Neutron Fluence Spectra in Terms of an Equivalent Monoenergetic Neutron…
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ASTM-E722 2009
E722-09e1 Standard Practice for Characterizing Neutron Fluence Spectra in Terms of an Equivalent Monoenergetic Neutron…
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ASTM-F996 2003
F996-98(2003) Standard Test Method for Separating an Ionizing Radiation-Induced MOSFET Threshold Voltage Shift Into Components…
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ASTM-F996 2011(Redline)
F996-11 Standard Test Method for Separating an Ionizing Radiation-Induced MOSFET Threshold Voltage Shift Into Components…
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ASTM-F996 2011
F996-11 Standard Test Method for Separating an Ionizing Radiation-Induced MOSFET Threshold Voltage Shift Into Components…
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ASTM-E431:2002 Edition
E431-96(2002) Standard Guide to Interpretation of Radiographs of Semiconductors and Related Devices Published By Publication…
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ASTM-E427 2000
E427-95(2000) Standard Practice for Testing for Leaks Using the Halogen Leak Detector (Alkali-Ion Diode) Published…
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ASTM-F1893:2011 Edition(Redline)
F1893-11 Guide for Measurement of Ionizing Dose-Rate Survivability and Burnout of Semiconductor Devices (Redline) Published…
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ASTM-F1893:2011 Edition
F1893-11 Guide for Measurement of Ionizing Dose-Rate Survivability and Burnout of Semiconductor Devices Published By…
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ASTM-F1190:1993 Edition
F1190-93 Standard Guide for Neutron Irradiation of Unbiased Electronic Components Published By Publication Date Number…
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ASTM-E722 2009(Redline)
E722-09e1 Standard Practice for Characterizing Neutron Fluence Spectra in Terms of an Equivalent Monoenergetic Neutron…
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ASTM-D6555 2008(Redline)
D6555-03(2008) Standard Guide for Evaluating System Effects in Repetitive-Member Wood Assemblies (Redline) Published By Publication…
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ASTM-F996 2010
F996-10 Standard Test Method for Separating an Ionizing Radiation-Induced MOSFET Threshold Voltage Shift Into Components…
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ASTM-E431:2007 Edition
E431-96(2007) Standard Guide to Interpretation of Radiographs of Semiconductors and Related Devices Published By Publication…
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ASTM-E427 2006
E427-95(2006) Standard Practice for Testing for Leaks Using the Halogen Leak Detector(Alkali-Ion Diode) Published By…
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ASTM-E1161:2009 Edition
E1161-09 Standard Practice for Radiologic Examination of Semiconductors and Electronic Components Published By Publication Date…