This part of the IEC 60679 series applies to the phase jitter measurement of quartz crystal oscillators and SAW oscillators used for electronic devices and gives guidance for phase jitter that allows the accurate measurement of r.m.s. jitter.<\/p>\n
In the measurement method, phase noise measurement equipment or a phase noise measurement system is used.<\/p>\n
The measuring frequency range is from 10 MHz to1 000 MHz.<\/p>\n
This standard applies to quartz crystal oscillators and SAW oscillators used in electronic devices and modules that have the multiplication or division functions based on these oscillators. The type of phase jitter applied to these oscillators is the r.m.s. jitter. In the following text, these oscillators and modules will be referred to as \u201coscillator(s)\u201d for simplicity.<\/p>\n
| PDF Pages<\/th>\n | PDF Title<\/th>\n<\/tr>\n | ||||||
|---|---|---|---|---|---|---|---|
| 6<\/td>\n | English \n CONTENTS <\/td>\n<\/tr>\n | ||||||
| 8<\/td>\n | INTRODUCTION <\/td>\n<\/tr>\n | ||||||
| 10<\/td>\n | 1 Scope 2 Normative references 3 Terms, definitions and general concepts 3.1 Terms and definitions 3.2 General concepts <\/td>\n<\/tr>\n | ||||||
| 11<\/td>\n | Figures \n Figure 1 \u2013 Voltage versus time <\/td>\n<\/tr>\n | ||||||
| 12<\/td>\n | Figure 2 \u2013 Explanatory diagram of the amount of jitter applied to r.m.s. jitter <\/td>\n<\/tr>\n | ||||||
| 13<\/td>\n | Figure 3 \u2013 Explanatory diagram of random jitter, deterministic jitter, and total jitter <\/td>\n<\/tr>\n | ||||||
| 14<\/td>\n | 3.3 Points to be considered for measurement <\/td>\n<\/tr>\n | ||||||
| 15<\/td>\n | 4 Measurement method 4.1 General 4.2 Frequency range and the measurement method 4.3 Method using the phase noise measurement value <\/td>\n<\/tr>\n | ||||||
| 16<\/td>\n | 4.4 Measurement method using the specially designed measurement equipment 4.5 Block diagram of the measurement <\/td>\n<\/tr>\n | ||||||
| 17<\/td>\n | 4.6 Input and output impedance of the measurement system 4.7 Measurement equipment Figure 4 \u2013 Equivalent block diagram <\/td>\n<\/tr>\n | ||||||
| 18<\/td>\n | 4.8 Test fixture 4.9 Cable, tools and instruments 5 Measurement and the measurement environment 5.1 Set-up before taking measurements 5.2 Points to be considered and noted at the time of measurement <\/td>\n<\/tr>\n | ||||||
| 19<\/td>\n | 5.3 Treatment after the measurement 6 Measurement 6.1 Reference temperature 6.2 Measurement of temperature characteristics 6.3 Measurement under vibration 6.4 Measurement at the time of impact 6.5 Measurement in accelerated ageing 7 Other points to be noted 8 Miscellaneous <\/td>\n<\/tr>\n | ||||||
| 20<\/td>\n | Annex A (normative) \nCalculation method for the amount of phase jitter <\/td>\n<\/tr>\n | ||||||
| 21<\/td>\n | Figure A.1 \u2013 Concept diagram of SSB phase noise <\/td>\n<\/tr>\n | ||||||
| 23<\/td>\n | Bibliography <\/td>\n<\/tr>\n<\/table>\n","protected":false},"excerpt":{"rendered":" Quartz crystal controlled oscillators of assessed quality – Phase jitter measurement method for quartz crystal oscillators and SAW oscillators. Application guidelines<\/b><\/p>\n |