{"id":248470,"date":"2024-10-19T16:22:13","date_gmt":"2024-10-19T16:22:13","guid":{"rendered":"https:\/\/pdfstandards.shop\/product\/uncategorized\/bs-en-iec-61280-4-52020\/"},"modified":"2024-10-25T11:32:02","modified_gmt":"2024-10-25T11:32:02","slug":"bs-en-iec-61280-4-52020","status":"publish","type":"product","link":"https:\/\/pdfstandards.shop\/product\/publishers\/bsi\/bs-en-iec-61280-4-52020\/","title":{"rendered":"BS EN IEC 61280-4-5:2020"},"content":{"rendered":"
PDF Pages<\/th>\n | PDF Title<\/th>\n<\/tr>\n | ||||||
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2<\/td>\n | undefined <\/td>\n<\/tr>\n | ||||||
7<\/td>\n | CONTENTS <\/td>\n<\/tr>\n | ||||||
12<\/td>\n | FOREWORD <\/td>\n<\/tr>\n | ||||||
14<\/td>\n | 1 Scope 2 Normative references <\/td>\n<\/tr>\n | ||||||
15<\/td>\n | 3 Terms, definitions, graphical symbols and abbreviated terms 3.1 Terms and definitions <\/td>\n<\/tr>\n | ||||||
17<\/td>\n | 3.2 Graphical symbols <\/td>\n<\/tr>\n | ||||||
18<\/td>\n | Figures Figure 1 \u2013 Connector and apparatus symbols <\/td>\n<\/tr>\n | ||||||
19<\/td>\n | 3.3 Abbreviated terms 4 Test methods 4.1 General Figure 2 \u2013 Symbol for cabling under test <\/td>\n<\/tr>\n | ||||||
20<\/td>\n | 4.2 Cabling configurations and applicable test methods <\/td>\n<\/tr>\n | ||||||
21<\/td>\n | 5 Overview of uncertainties 5.1 General 5.2 Sources of significant uncertainties Tables Table 1 \u2013 Cabling configurations Table 2 \u2013 Test methods and configurations <\/td>\n<\/tr>\n | ||||||
22<\/td>\n | 5.3 Consideration of the PM 5.4 Consideration of test cord connector grade 5.5 Typical uncertainty values for multimode testing Table 3 \u2013 Measurements bias related to test cord connector grade <\/td>\n<\/tr>\n | ||||||
23<\/td>\n | Table 4 \u2013 Uncertainty for a given attenuation at 850 nm using same photodetector <\/td>\n<\/tr>\n | ||||||
24<\/td>\n | 5.6 Typical uncertainty values for single-mode testing Table 5 \u2013 Uncertainty for a given attenuation at 850 nm using different photodetectors Table 6 \u2013 Uncertainty for a given attenuation at 1 310 nm using same photodetector <\/td>\n<\/tr>\n | ||||||
25<\/td>\n | 6 Apparatus 6.1 General 6.2 Light source 6.2.1 General 6.2.2 Stability Table 7 \u2013 Uncertainty for a given attenuation at 1 310 nm using different photodetectors <\/td>\n<\/tr>\n | ||||||
26<\/td>\n | 6.2.3 Spectral characteristics (LSPM measurement) 6.3 Launch cord Table 8 \u2013 Spectral requirements <\/td>\n<\/tr>\n | ||||||
27<\/td>\n | 6.4 Receive or tail cord 6.5 Substitution cord <\/td>\n<\/tr>\n | ||||||
28<\/td>\n | 6.6 Adapter cord 6.7 Power meter \u2013 LSPM methods only <\/td>\n<\/tr>\n | ||||||
29<\/td>\n | 6.8 OTDR apparatus 6.9 Connector end face cleaning and inspection equipment 6.10 Adapters 7 Procedures 7.1 General Figure 3 \u2013 OTDR schematic with external optical switch <\/td>\n<\/tr>\n | ||||||
30<\/td>\n | 7.2 Common procedures 7.2.1 Care of the test cords 7.2.2 Take reference measurements 7.2.3 Inspect and clean the ends of the optical fibres in the cabling 7.2.4 Take the measurements 7.2.5 Make the calculations 7.2.6 Multi-fibre and bi-directional testing <\/td>\n<\/tr>\n | ||||||
31<\/td>\n | 7.3 Calibration 7.4 Safety 8 Calculations 9 Documentation 9.1 Information for each test 9.2 Information to be available <\/td>\n<\/tr>\n | ||||||
32<\/td>\n | Annex A (normative)One-cord method A.1 Applicability of the test method A.2 Apparatus A.3 Procedure for unpinned to unpinned cabling with unpinned power meter <\/td>\n<\/tr>\n | ||||||
33<\/td>\n | A.4 Procedure for unpinned to pinned cabling with unpinned power meter Figure A.1 \u2013 Reference measurement for unpinnedto unpinned cabling using unpinned power meter Figure A.2 \u2013 Test measurement for unpinnedto unpinned cabling using unpinned power meter <\/td>\n<\/tr>\n | ||||||
34<\/td>\n | A.5 Procedure for pinned to pinned cabling with pinned power meter Figure A.3 \u2013 Reference measurement for unpinnedto pinned cabling using unpinned power meter Figure A.4 \u2013 Test measurement for unpinnedto pinned cabling using unpinned power meter <\/td>\n<\/tr>\n | ||||||
35<\/td>\n | A.6 Procedure for unpinned to unpinned cabling with pinned power meter and gender-neutral test cord Figure A.5 \u2013 Reference measurement for pinnedto pinned cabling using pinned power meter Figure A.6 \u2013 Test measurement for pinned to pinned cabling using pinned power meter <\/td>\n<\/tr>\n | ||||||
36<\/td>\n | A.7 Calculation A.8 Components of reported attenuation Figure A.7 \u2013 Reference measurement for unpinnedto unpinned cabling using pinned power meter Figure A.8 \u2013 Test measurement for unpinned to unpinned cabling(gender-neutral TC1) using pinned power meter <\/td>\n<\/tr>\n | ||||||
37<\/td>\n | Annex B (normative)Three-cord method B.1 Applicability of the test method B.2 Apparatus B.3 Procedure for unpinned to unpinned cabling <\/td>\n<\/tr>\n | ||||||
38<\/td>\n | B.4 Procedure for unpinned to pinned cabling Figure B.1 \u2013 Reference measurement for unpinnedto unpinned cabling using pinned power meter Figure B.2 \u2013 Test measurement for unpinnedto unpinned cabling using pinned power meter <\/td>\n<\/tr>\n | ||||||
39<\/td>\n | B.5 Procedure for pinned to pinned cabling Figure B.3 \u2013 Reference measurement for unpinnedto pinned cabling using pinned power meter Figure B.4 \u2013 Test measurement for unpinnedto pinned cabling using pinned power meter <\/td>\n<\/tr>\n | ||||||
40<\/td>\n | B.6 Procedure, channel test (general) Figure B.5 \u2013 Reference measurement for pinnedto pinned cabling using unpinned power meter Figure B.6 \u2013 Test measurement for pinned to pinned cablingusing unpinned power meter <\/td>\n<\/tr>\n | ||||||
41<\/td>\n | B.7 Calculations B.8 Components of reported attenuation Figure B.7 \u2013 Reference measurement for channel test using unpinned power meter Figure B.8 \u2013 Test measurement for channel test using unpinned power meter <\/td>\n<\/tr>\n | ||||||
42<\/td>\n | Annex C (normative)Adapter-cord method C.1 Applicability of the test method C.2 Apparatus C.3 Procedure for unpinned to unpinned cabling with pinned power meter <\/td>\n<\/tr>\n | ||||||
43<\/td>\n | C.4 Procedure for unpinned to pinned cabling with pinned power meter Figure C.1 \u2013 Reference measurement for unpinnedto unpinned cabling using pinned power meter Figure C.2 \u2013 Test measurement for unpinned to unpinnedcabling using pinned power meter <\/td>\n<\/tr>\n | ||||||
44<\/td>\n | C.5 Procedure for pinned to unpinned cabling with unpinned power meter Figure C.3 \u2013 Reference measurement for unpinnedto pinned cabling using pinned power meter Figure C.4 \u2013 Test measurement for unpinnedto pinned cabling using pinned power meter <\/td>\n<\/tr>\n | ||||||
45<\/td>\n | C.6 Procedure for pinned to pinned cabling with unpinned power meter Figure C.5 \u2013 Reference measurement for unpinnedto pinned cabling using unpinned power meter Figure C.6 \u2013 Test measurement for unpinnedto pinned cabling using unpinned power meter <\/td>\n<\/tr>\n | ||||||
46<\/td>\n | C.7 Calculations Figure C.7 \u2013 Reference measurement for unpinnedto pinned cabling using unpinned power meter Figure C.8 \u2013 Test measurement for unpinnedto pinned cabling using unpinned power meter <\/td>\n<\/tr>\n | ||||||
47<\/td>\n | C.8 Components of reported attenuation <\/td>\n<\/tr>\n | ||||||
48<\/td>\n | Annex D (normative)Equipment cord method D.1 Applicability of the test method D.2 Apparatus D.3 Procedure <\/td>\n<\/tr>\n | ||||||
49<\/td>\n | D.4 Calculation D.5 Components of reported attenuation Figure D.1 \u2013 Reference measurement using pinned power meter Figure D.2 \u2013 Test measurement using pinned power meter <\/td>\n<\/tr>\n | ||||||
50<\/td>\n | D.6 Typical uncertainty values Table D.1 \u2013 Uncertainty for a given attenuation when equipment cord method is used <\/td>\n<\/tr>\n | ||||||
51<\/td>\n | Annex E (normative)Optical time domain reflectometer E.1 Applicability of the test method E.2 Apparatus E.2.1 General E.2.2 OTDR <\/td>\n<\/tr>\n | ||||||
52<\/td>\n | E.2.3 Test cords E.3 Procedure (test method) <\/td>\n<\/tr>\n | ||||||
53<\/td>\n | E.4 Calculation E.4.1 General E.4.2 Connection location Figure E.1 \u2013 OTDR method <\/td>\n<\/tr>\n | ||||||
54<\/td>\n | E.4.3 Definition of the power levels F1 and F2 Figure E.2 \u2013 Location of the ports of the cabling under test <\/td>\n<\/tr>\n | ||||||
55<\/td>\n | E.4.4 Alternative calculation Figure E.3 \u2013 Graphic construction of F1 and F2 <\/td>\n<\/tr>\n | ||||||
56<\/td>\n | Figure E.4 \u2013 Graphic construction of F1, F11, F12 and F2 <\/td>\n<\/tr>\n | ||||||
57<\/td>\n | E.5 OTDR uncertainties <\/td>\n<\/tr>\n | ||||||
58<\/td>\n | Annex F (normative)Requirements for the multimode source characteristics <\/td>\n<\/tr>\n | ||||||
59<\/td>\n | Annex G (informative)OTDR configuration information G.1 General G.2 Other measurement configurations G.2.1 General G.2.2 Measurement with low return loss connectors or short length cabling <\/td>\n<\/tr>\n | ||||||
60<\/td>\n | Figure G.1 \u2013 Attenuation measurement with low return loss connectors <\/td>\n<\/tr>\n | ||||||
61<\/td>\n | G.2.3 Measurement with APC connectors Figure G.2 \u2013 Attenuation measurement of a short length cabling <\/td>\n<\/tr>\n | ||||||
62<\/td>\n | Figure G.3 \u2013 Attenuation measurement with APC MPO connections <\/td>\n<\/tr>\n | ||||||
63<\/td>\n | Annex H (informative)Test cord, breakout cord, and cassette attenuation verification H.1 General H.2 Apparatus H.3 General procedure H.3.1 Overview <\/td>\n<\/tr>\n | ||||||
64<\/td>\n | H.3.2 Test cord verification Figure H.1 \u2013 Obtaining reference power level P1 Figure H.2 \u2013 Obtaining power level P2 <\/td>\n<\/tr>\n | ||||||
65<\/td>\n | H.3.3 Cassette and breakout cord verification Figure H.3 \u2013 Obtaining reference power level P1 Figure H.4 \u2013 Obtaining power level P2 <\/td>\n<\/tr>\n | ||||||
66<\/td>\n | H.4 Test cord verification prior to cabling measurement H.4.1 General H.4.2 Procedure for unpinned to unpinned cabling measurement Figure H.5 \u2013 Test measurement for unpinned to unpinned cabling Figure H.6 \u2013 Step 1: obtaining reference power level P1 <\/td>\n<\/tr>\n | ||||||
67<\/td>\n | H.4.3 Procedure for unpinned to pinned cabling measurement Figure H.7 \u2013 Step 2: verification cords, obtaining power level P2 Figure H.8 \u2013 Test measurement for unpinned to pinned cabling <\/td>\n<\/tr>\n | ||||||
68<\/td>\n | H.4.4 Procedure for pinned to pinned cabling measurement Figure H.9 \u2013 Step 1: obtaining reference power level P1 Figure H.10 \u2013 Step 2: obtaining power level P2 Figure H.11 \u2013 Test measurement for pinned to pinned cabling <\/td>\n<\/tr>\n | ||||||
69<\/td>\n | Figure H.12 \u2013 Step 1: obtaining reference power level P1 Figure H.13 \u2013 Step 2: verification of cords, obtaining power level P2 <\/td>\n<\/tr>\n | ||||||
70<\/td>\n | Figure H.14 \u2013 Step 3: verification of receive cord, obtaining power level P3 <\/td>\n<\/tr>\n | ||||||
71<\/td>\n | Annex I (normative)On the use of low attenuation grade test cords I.1 General I.2 Practical configurations and assumptions I.2.1 Component specifications <\/td>\n<\/tr>\n | ||||||
72<\/td>\n | I.2.2 Conventions I.2.3 Reference planes <\/td>\n<\/tr>\n | ||||||
73<\/td>\n | I.3 Impact of using low attenuation grade test cords for recommended LSPM methods I.4 Examples for LSPM measurements I.4.1 Example 1: Configuration Au-u, 1-C method (Annex A) Table I.1 \u2013 Measurement bias adjustment when using low attenuation grade test cords <\/td>\n<\/tr>\n | ||||||
74<\/td>\n | I.4.2 Example 2: Configuration Du-u, EC method (Annex D) I.5 Impact of using reference grade test cords for different configurations using the OTDR test method I.5.1 Cabling configurations Au-u, Ap-u and Ap-p <\/td>\n<\/tr>\n | ||||||
75<\/td>\n | I.5.2 Cabling configuration Du-u Figure I.1 \u2013 Cabling configurations Au-u, Ap-u and Ap-p tested with OTDR method Table I.2 \u2013 Acceptance figure adjustment using low attenuation grade test cords \u2013 OTDR method <\/td>\n<\/tr>\n | ||||||
76<\/td>\n | Figure I.2 \u2013 Cabling configuration Du-u tested with OTDR method <\/td>\n<\/tr>\n | ||||||
77<\/td>\n | Bibliography <\/td>\n<\/tr>\n<\/table>\n","protected":false},"excerpt":{"rendered":" Fibre-optic communication subsystem test procedures – Installed cabling plant. Attenuation measurement of MPO terminated fibre optic cabling plant using test equipment with MPO interfaces<\/b><\/p>\n |