{"id":248886,"date":"2024-10-19T16:24:04","date_gmt":"2024-10-19T16:24:04","guid":{"rendered":"https:\/\/pdfstandards.shop\/product\/uncategorized\/asme-b46-1-2019\/"},"modified":"2024-10-25T11:35:21","modified_gmt":"2024-10-25T11:35:21","slug":"asme-b46-1-2019","status":"publish","type":"product","link":"https:\/\/pdfstandards.shop\/product\/publishers\/asme\/asme-b46-1-2019\/","title":{"rendered":"ASME B46.1 2019"},"content":{"rendered":"

This Standard is concerned with the geometric irregularities of surfaces. It defines surface texture and its constituents: roughness, waviness, and lay. It also defines parameters for specifying surface texture. The terms and ratings in this Standard relate to surfaces produced by such means as abrading, casting, coating, cutting, etching, plastic deformation, sintering, wear, erosion, etc. Intended for design, drafting, mechanical, manufacturing, production, tool\/gage, quality, process and project engineers, CAD\/CAM\/CAE specialists, inspectors and educators across a broad range of global manufacturing. Special emphasis on aerospace, automotive, medical device, precision instrumentation and related industries.<\/p>\n

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PDF Pages<\/th>\nPDF Title<\/th>\n<\/tr>\n
4<\/td>\nCONTENTS <\/td>\n<\/tr>\n
10<\/td>\nFOREWORD <\/td>\n<\/tr>\n
12<\/td>\nASME B46 COMMITTEE ROSTER <\/td>\n<\/tr>\n
13<\/td>\nCORRESPONDENCE WITH THE B46 COMMITTEE <\/td>\n<\/tr>\n
15<\/td>\nEXECUTIVE SUMMARY <\/td>\n<\/tr>\n
16<\/td>\nASME B46.1-2019 SUMMARY OF CHANGES <\/td>\n<\/tr>\n
18<\/td>\nSection 1 Terms Related to Surface Texture
1-1 GENERAL
1-1.1 Scope
1-1.2 Limitations
1-1.3 SI Values
1-1.4 References
1-1.5 Cleanliness
1-2 DEFINITIONS RELATED TO SURFACES
1-2.1 Surfaces <\/td>\n<\/tr>\n
19<\/td>\n1-2.2 Components of the Real Surface
Figures
Figure 1-2.1-1 Schematic Diagram of Surface Characteristics <\/td>\n<\/tr>\n
20<\/td>\n1-3 DEFINITIONS RELATED TO THE MEASUREMENT OF SURFACE TEXTURE BY PROFILING METHODS
1-3.1 Profiles
1-3.2 Reference Lines
1-3.3 Peaks and Valleys, Height Resolution, and Height Range
Figure 1-3.1-1 Measured Versus Nominal Profile <\/td>\n<\/tr>\n
21<\/td>\n1-3.4 Spacings
Figure 1-3.1.1-1 Stylus Profile Displayed With Two Different Aspect Ratios <\/td>\n<\/tr>\n
22<\/td>\n1-3.5 Measurement and Analysis Lengths
Figure 1-3.2-1 Filtering a Surface Profile <\/td>\n<\/tr>\n
23<\/td>\n1-4 DEFINITIONS OF SURFACE PARAMETERS FOR PROFILING METHODS
1-4.1 Height (z) Parameters
Figure 1-3.2-2 Examples of Nominal Profiles <\/td>\n<\/tr>\n
24<\/td>\nFigure 1-3.3-1 Profile Peak, Valley, and Element
Figure 1-3.5-1 Surface Profile Measurement Lengths
Figure 1-4.1.1-1 Rt, Rp, and Rv Parameters <\/td>\n<\/tr>\n
25<\/td>\nFigure 1-4.1.1-2 The Rt and Rmax Parameters
Figure 1-4.1.1-3 Illustration for the Calculation of Roughness Average Ra <\/td>\n<\/tr>\n
26<\/td>\n1-4.2 Spacing Parameters
1-4.3 Shape Parameters and Functions
Figure 1-4.1.1-4 Surface Profile Containing Two Sampling Lengths, l1 and l2, Also Showing the Rpi and Rti Parameters
Figure 1-4.1.2-1 The Waviness Height, Wt <\/td>\n<\/tr>\n
27<\/td>\nFigure 1-4.2-1 The Mean Spacing of Profile Elements, RSm <\/td>\n<\/tr>\n
29<\/td>\nFigure 1-4.2-2 The Peak Count Level, Used for Calculating Peak Density
Figure 1-4.3-1 Amplitude Density Function \u2014 ADF(z) or p(z) <\/td>\n<\/tr>\n
30<\/td>\n1-4.4 Hybrid Parameters
Figure 1-4.3-2 The Bearing Area Curve and Related Parameters <\/td>\n<\/tr>\n
31<\/td>\nFigure 1-4.3-3 Three Surface Profiles With Different Kurtosis
Figure 1-4.3-4 The Profile Bearing Length <\/td>\n<\/tr>\n
32<\/td>\n1-4.5 Linear Material Ratio Curve Height Parameters
1-4.6 Material Probability Curve Height Parameters
1-5 DEFINITIONS RELATED TO THE MEASUREMENT OF SURFACE TEXTURE BY AREA PROFILING AND AREA AVERAGING METHODS
1-5.1 General
1-5.2 Reference Mean Surfaces
1-5.3 Area Peaks and Valleys
Figure 1-4.3-5 Three Surface Profiles With Different Skewness <\/td>\n<\/tr>\n
33<\/td>\n1-5.4 Sampling Areas
1-6 DEFINITIONS OF SURFACE PARAMETERS FOR AREA PROFILING AND AREA AVERAGING METHODS
1-6.1 Height Parameters
Figure 1-5.1-1 Topographic Map Obtained by an Area Profiling Method
Figure 1-5.3-1 Area Peaks (Left) and Area Valleys (Right) <\/td>\n<\/tr>\n
34<\/td>\n1-6.2 Waviness Parameter
1-6.3 Area Spacing Parameters
1-6.4 Shape Parameters
1-6.5 Other Parameters <\/td>\n<\/tr>\n
35<\/td>\nFigure 1-6.3-1 Comparison of Profiles Measured in Two Directions on a Uniaxial Periodic Surface Showing the Difference in Peak Spacing as a Function of Direction <\/td>\n<\/tr>\n
37<\/td>\nFigure 1-6.5-1 Indication of Surface Lay <\/td>\n<\/tr>\n
38<\/td>\nSection 2 Classification of Instruments for Surface Texture Measurement
2-1 SCOPE
2-2 RECOMMENDATION
Figure 2-1-1 Classification of Common Instruments for Measurement of Surface Texture <\/td>\n<\/tr>\n
39<\/td>\n2-3 CLASSIFICATION SCHEME
2-3.1 Type I: Profiling, Contact, Skidless Instruments
2-3.2 Type II: Profiling, Noncontact Instruments
2-3.3 Type III: Scanned Probe Microscopes <\/td>\n<\/tr>\n
40<\/td>\n2-3.4 Type IV: Profiling, Contact, Skidded Instruments
2-3.5 Type V: Skidded Instruments With Parameters Only
2-3.6 Type VI: Area Averaging Methods <\/td>\n<\/tr>\n
41<\/td>\nSection 3 Terminology and Measurement Procedures for Profiling, Contact, Skidless Instruments
3-1 SCOPE
3-2 REFERENCES
3-3 TERMINOLOGY
3-3.1 Profiling, Contact, Skidless Instruments
3-3.2 Measuring Loop
3-3.3 Profile Coordinate System
3-3.4 Stylus <\/td>\n<\/tr>\n
42<\/td>\nFigure 3-3.3-1 Profile Coordinate System
Figure 3-3.4.2-1 Conical Stylus Tip <\/td>\n<\/tr>\n
43<\/td>\n3-3.5 Pickup
Figure 3-3.4.3-1 Other Stylus Tip Geometries <\/td>\n<\/tr>\n
44<\/td>\n3-3.6 Drive Unit
3-3.7 Amplifier
3-3.8 Analog-to-Digital Conversion
3-3.9 Primary Measured Profile
3-3.10 Instrument Sinusoidal Transmission Function
3-3.11 Instrument Nonlinearity <\/td>\n<\/tr>\n
45<\/td>\n3-3.12 Instrument Measuring Range
3-3.13 Instrument Measuring z Resolution
3-3.14 Instrument z Range-to-Resolution Ratio
3-3.15 Zero Point Drift
3-3.16 Residual Profile
3-3.17 x-Axis Profile Component Deviations
3-3.18 Short-Wave Transmission Limit
3-3.19 Profile Filter
3-3.20 Profile Filter Cutoff Selection
Figure 3-3.8.3-1 Aliasing <\/td>\n<\/tr>\n
46<\/td>\n3-3.21 Profile Recording and Display
3-3.22 Profile Evaluation
3-4 MEASUREMENT PROCEDURE
3-4.1 Stylus Inspection
Tables
Table 3-3.20.1-1 Cutoff Values for Periodic Profiles Using RSm
Table 3-3.20.2-1 Cutoff Values for Nonperiodic Profiles Using Ra <\/td>\n<\/tr>\n
47<\/td>\n3-4.2 Instrument Calibration
3-4.3 Workpiece Cleanliness
3-4.4 Workpiece Fixturing
3-4.5 Instrument\/Workpiece Leveling and Alignment
3-4.6 Assessment of the Workpiece Surface <\/td>\n<\/tr>\n
48<\/td>\nSection 4 Measurement Procedures for Contact, Skidded Instruments
4-1 SCOPE
4-1.1 General
4-1.2 Type IV and Type V Instruments
4-2 REFERENCES
4-3 PURPOSE
4-4 INSTRUMENTATION
4-4.1 Roughness Average Value Ra From Averaging and Digital Readout Instruments <\/td>\n<\/tr>\n
49<\/td>\n4-4.2 Cutoff Selection
Figure 4-1.2-1 Schematic Diagrams of a Typical Stylus Probe and Fringe-Field Capacitance Probe
Table 4-4.2-1 Measurement Cutoffs and Traversing Lengths for Continuously Averaging Instruments Using Analog Meter Readouts <\/td>\n<\/tr>\n
50<\/td>\n4-4.3 Response Time for Analog Averaging Instruments
4-4.4 Traversing Length for Analog Averaging Instruments
4-4.5 Stylus Probe
4-4.6 Fringe-Field Capacitance (FFC) Probe
Table 4-4.2-2 Measurement Cutoffs and Minimum Evaluation Lengths for Instruments Measuring Integrated Roughness Values Over a Fixed Evaluation Length <\/td>\n<\/tr>\n
51<\/td>\n4-4.7 Possible Sources of Skid Errors
4-4.8 Instrument Accuracy
4-4.9 Operational Accuracy
Figure 4-4.2-1 Effects of Various Cutoff Values <\/td>\n<\/tr>\n
52<\/td>\nFigure 4-4.7-1 Examples of Profile Distortion Due to Skid Motion
Figure 4-4.7-2 Examples of Profile Distortion <\/td>\n<\/tr>\n
53<\/td>\nSection 5 Measurement Techniques for Area Profiling
5-1 SCOPE
5-2 REFERENCES
5-3 RECOMMENDATIONS
5-4 IMAGING METHODS
5-5 SCANNING METHODS <\/td>\n<\/tr>\n
54<\/td>\nSection 6 Measurement Techniques for Area Averaging
6-1 SCOPE
6-2 EXAMPLES OF AREA AVERAGING METHODS <\/td>\n<\/tr>\n
55<\/td>\nSection 7 Nanometer Surface Texture and Step Height Measurements by Stylus Profiling Instruments
7-1 SCOPE
7-2 APPLICABLE DOCUMENTS
7-3 DEFINITIONS
7-3.1 Step Height, Zs
7-3.2 Noise
7-3.3 Type A Evaluation (of Uncertainty)
7-3.4 Type B Evaluation (of Uncertainty)
7-3.5 Standard Uncertainty
7-3.6 Combined Standard Uncertainty
7-3.7 Expanded Uncertainty
7-3.8 Coverage Factor, k <\/td>\n<\/tr>\n
56<\/td>\n7-4 RECOMMENDATIONS
7-4.1 Instruments
7-4.2 Methodology <\/td>\n<\/tr>\n
57<\/td>\n7-4.3 Environment
7-5 PREPARATION FOR MEASUREMENT
7-5.1 Instruments
Figure 7-4.2.4-1 The Radius of Curvature for a Surface Sine Wave
Figure 7-4.2.5-1 Stylus Tip Touching Bottom and Shoulders of Groove <\/td>\n<\/tr>\n
58<\/td>\n7-5.2 Environment
7-6 CALIBRATION ARTIFACTS
7-6.1 Calibration Specimens
7-6.2 Calibrated Displacement Actuators
7-6.3 Ultrasmooth Surface Artifacts
7-6.4 Artifact Calibration Requirements
Figure 7-4.2.5-2 The Stylus Tip Contact Distance, x <\/td>\n<\/tr>\n
59<\/td>\n7-7 REPORTS
7-7.1 Data
7-7.2 Annotations to the Data
7-7.3 Reporting Example <\/td>\n<\/tr>\n
60<\/td>\nSection 8 Nanometer Surface Roughness as Measured With Phase Measuring Interferometric Microscopy
8-1 SCOPE
8-2 DESCRIPTION AND DEFINITIONS: NONCONTACT PHASE MEASURING INTERFEROMETER
8-3 KEY SOURCES OF UNCERTAINTY <\/td>\n<\/tr>\n
61<\/td>\nFigure 8-2-1 A Typical Phase Measuring Interferometer System
Figure 8-2-2 Demonstration of the Detector Array With Element Spacing, \u0394, and the Measurement of the Longest Spatial Wavelength, \u03bbL, Covering the Total Number of Pixels, N <\/td>\n<\/tr>\n
62<\/td>\n8-4 NONCONTACT PHASE MEASURING INTERFEROMETER INSTRUMENT REQUIREMENTS
8-4.1 Tilt Adjustment
8-4.2 Sample Stage
8-4.3 Focusing Means
8-4.5 Reference Path rms Variation
8-5 TEST METHODS
8-5.1 Instrument Preparations and Environmental Stability
8-5.2 Instrument Accuracy
8-6 MEASUREMENT PROCEDURES
8-6.1 Direct Profile Method
Figure 8-2-3 Demonstration of the Detector Array With Element Spacing, \u0394, and the Measurement of the Smallest Spatial Wavelength, \u03bbR, Covering Five Pixels <\/td>\n<\/tr>\n
63<\/td>\n8-6.2 Subtract Reference Method
8-6.3 Absolute Rq Method
8-7 DATA ANALYSIS AND REPORTING
8-8 REFERENCES <\/td>\n<\/tr>\n
64<\/td>\nSection 9 Filtering of Surface Profiles
9-1 SCOPE
9-2 REFERENCES
9-3 DEFINITIONS AND GENERAL SPECIFICATIONS
9-3.1 Notes on Terms Defined Previously <\/td>\n<\/tr>\n
65<\/td>\n9-3.2 Definitions of Terms Associated With Filtering
9-4 2RC FILTER SPECIFICATION FOR ROUGHNESS
9-4.1 The 2RC Transmission Band
9-4.2 Long-Wavelength Cutoff
9-4.3 Transmission Characteristics <\/td>\n<\/tr>\n
66<\/td>\nFigure 9-3.2-1 Wavelength Transmission Characteristics for the 2RC Filter System
Figure 9-3.2-2 Gaussian Transmission Characteristics Together With the Uncertain Nominal Transmission Characteristic of a 2 \u03bcm Stylus Radius <\/td>\n<\/tr>\n
67<\/td>\n9-4.4 2RC Filter Long-Wavelength Roughness Weighting Function
9-5 PHASE CORRECT GAUSSIAN FILTER FOR ROUGHNESS
9-5.1 Phase Correct Gaussian Filter Mean Line
9-5.2 Gaussian Filter Roughness Profile
9-5.3 Long-Wavelength Cutoff of the Gaussian Phase Correct Filter
9-5.4 Short-Wavelength Cutoff of the Gaussian Roughness Profile
Figure 9-3.2-3 Weighting Function of the Gaussian Profile Filter <\/td>\n<\/tr>\n
68<\/td>\n9-5.5 Short-Wavelength Transmission Characteristic
9-5.6 Weighting Function for the Roughness Short-Wavelength Cutoff
9-5.7 Weighting Function for the Roughness Long-Wavelength Cutoff
9-5.8 Transmission Characteristic of the Gaussian-Filtered Waviness Profile (Roughness Mean Line)
Table 9-4.3.2-1 Limits for the Transmission Characteristics for 2RC Long-Wavelength Cutoff Filters <\/td>\n<\/tr>\n
69<\/td>\n9-5.9 Transmission Characteristic of the Gaussian Filtered Roughness Profile
9-5.10 Errors of Approximations to the Gaussian Filter
9-5.11 Transmission Band
Figure 9-5.8-1 Gaussian Transmission Characteristic for the Waviness Short-Wavelength Cutoff, \u03bbsw, or for Deriving the Roughness Mean Line Having Cutoff Wavelengths, \u03bbc <\/td>\n<\/tr>\n
70<\/td>\n9-5.12 Cutoff Ratio
9-6 FILTERING FOR WAVINESS
9-6.1 Gaussian Filter Waviness Profile
9-6.2 Waviness Long-Wavelength Cutoff and Evaluation Length
Figure 9-5.9-1 Gaussian Transmission Characteristic for the Roughness Long-Wavelength Cutoff Having Cutoff Wavelengths, \u03bbc <\/td>\n<\/tr>\n
71<\/td>\nFigure 9-5.10-1 Example of a Deviation Curve of an Implemented Filter From the Ideal Gaussian Filter as a Function of Spatial Wavelength
Table 9-5.11-1 Typical Cutoffs for Gaussian Filters and Associated Cutoff Ratios <\/td>\n<\/tr>\n
72<\/td>\n9-6.3 Waviness Traversing Length
9-6.4 Methods for Determining the Waviness Mean Line
9-6.5 Waviness Transmission Band
9-7 FILTERING OF SURFACES WITH STRATIFIED FUNCTIONAL PROPERTIES
Table 9-6.3-1 Typical Values for the Waviness Long-Wavelength Cutoff, \u03bbcw, and Recommended Minimum Values for the Waviness Traversing Length <\/td>\n<\/tr>\n
73<\/td>\nSection 10 Terminology and Procedures for Evaluation of Surface Textures Using Fractal Geometry
10-1 GENERAL
10-1.1 Scope
10-1.2 Limitations
10-2 DEFINITIONS RELATIVE TO FRACTAL-BASED ANALYSIS OF SURFACES
10-2.1 Basic Terms Relating to Fractal Geometry of Engineering Surfaces <\/td>\n<\/tr>\n
74<\/td>\nFigure 10-2.1.3-1 Self-Similarity Illustrated on a Simulated Profile
Figure 10-2.1.4-1 An Idealized Log-Log Plot of Relative Length (of a Profile) or Relative Area (of a Surface) Versus the Scale of Observation
Figure 10-2.1.9-1 An Idealized Log-Log Plot of Relative Length or Relative Area Versus the Scale of Observation (Length-Scale or Area-Scale Plot), Showing Multifractal Characteristics and Crossover Scales <\/td>\n<\/tr>\n
75<\/td>\n10-2.2 Analysis Methods and Associated Terms
Figure 10-2.2.1-1 Three Stepping Exercises From a Length-Scale Analysis on a Simulated Profile <\/td>\n<\/tr>\n
76<\/td>\n10-3 REPORTING THE RESULTS OF FRACTAL ANALYSES
Figure 10-2.2.2-1 Four Tiling Exercises From an Area-Scale Analysis <\/td>\n<\/tr>\n
77<\/td>\n10-3.1 Limits on the Scales of Observation
Figure 10-2.2.2.4-1 An Area-Scale Plot Including the Results of the Tiling Series in Figure 10-2.2.2-1
Table 10-3-1 Example of a Report on Fractal Analysis <\/td>\n<\/tr>\n
78<\/td>\n10-3.2 Plot of a Geometric Property Versus Scale
10-3.3 Complexity Parameter
10-3.4 Fractal Dimension
10-3.5 Slope of Plots of Geometric Property Versus Scale
10-3.6 Smooth-Rough Crossovers (SRC)
10-4 REFERENCES <\/td>\n<\/tr>\n
80<\/td>\nSection 11 Specifications and Procedures for Precision Reference Specimens
11-1 SCOPE
11-2 REFERENCES
11-3 DEFINITIONS
11-4 REFERENCE SPECIMENS: PROFILE SHAPE AND APPLICATION
11-4.1 Amplification (Step Height): Type A
Figure 11-4.1-1 Type A1 Groove <\/td>\n<\/tr>\n
81<\/td>\n11-4.2 Stylus Condition: Type B
11-4.3 Parameter Measurements: Type C
11-4.4 Overall Instrument Performance: Type D
11-5 PHYSICAL REQUIREMENTS
11-5.1 Materials
11-5.2 Size of the Specimen
11-5.3 Waviness and Flatness Limits
11-6 ASSIGNED VALUE CALCULATION
Figure 11-4.1-2 Type A2 Groove
Figure 11-5.3-1 Allowable Waviness Height, Wt, for Roughness Calibration Specimens <\/td>\n<\/tr>\n
82<\/td>\n11-7 MECHANICAL REQUIREMENTS
11-7.1 Types A1 and A2
11-7.2 Types B1, B2, and B3
11-7.3 Types C1, C2, C3, and C4
11-7.4 Types D1 and D2 <\/td>\n<\/tr>\n
83<\/td>\n11-8 MARKING
11-9 CALIBRATION INTERVAL <\/td>\n<\/tr>\n
84<\/td>\nFigure 11-7.1-1 Assessment of Calibrated Values for Type A1
Table 11-7.1-1 Nominal Values of Depth or Height and Examples of Width for Type A1 <\/td>\n<\/tr>\n
85<\/td>\nTable 11-7.1-2 Nominal Values of Depth and Radius for Type A2
Table 11-7.1-3 Tolerances and Uncertainties for Types A1 and A2 <\/td>\n<\/tr>\n
86<\/td>\nFigure 11-7.2-1 Type B1 Grooves: Set of Four Grooves
Table 11-7.2-1 Tip Size Estimation From the Profile Graph for Type B1 <\/td>\n<\/tr>\n
87<\/td>\nFigure 11-7.2-2 Type B2 or Type C2 Specimens With Multiple Grooves
Figure 11-7.2-3 Use of Type B3 Specimen <\/td>\n<\/tr>\n
88<\/td>\nFigure 11-7.3-1 Type C1 Grooves
Table 11-7.3-1 Typical Ra and RSm Values for Type C1 <\/td>\n<\/tr>\n
89<\/td>\nFigure 11-7.3-2 Type C3 Grooves
Table 11-7.3-2 Tolerances and Uncertainties for Types C1 Through C4
Table 11-7.3-3 Typical Values of Ra and RSm for Type C2 <\/td>\n<\/tr>\n
90<\/td>\nFigure 11-7.3-3 Type C4 Grooves
Table 11-7.3-4 Typical Values of Ra for Type C4 <\/td>\n<\/tr>\n
91<\/td>\nFigure 11-7.4-1 Unidirectional Irregular Groove Specimen Having Profile Repetition at 5\u03bbc Intervals (Type D1 With \u03bbc = 0.8 mm)
Table 11-7.4-1 Tolerances and Uncertainties for Types D1 and D2 <\/td>\n<\/tr>\n
92<\/td>\nSection 12 Specifications and Procedures for Roughness Comparison Specimens
12-1 SCOPE
12-2 REFERENCES
12-3 DEFINITIONS
12-4 ROUGHNESS COMPARISON SPECIMENS
12-4.1 Individually Manufactured (Pilot) Specimens
12-4.2 Replica Specimens
12-5 SURFACE CHARACTERISTICS
12-6 NOMINAL ROUGHNESS GRADES
12-7 SPECIMEN SIZE, FORM, AND LAY <\/td>\n<\/tr>\n
93<\/td>\n12-8 CALIBRATION OF COMPARISON SPECIMENS
12-9 MARKING
Table 12-6-1 Nominal Roughness Grades, Ra, for Roughness Comparison Specimens
Table 12-7-1 Form and Lay of Roughness Comparison Specimens Representing Various Types of Machined Surfaces <\/td>\n<\/tr>\n
94<\/td>\nTable 12-8-1 Examples of Sampling Lengths for Calibration of Comparison Specimens, mm <\/td>\n<\/tr>\n
95<\/td>\nNONMANDATORY APPENDICES
NONMANDATORY APPENDIX A GENERAL NOTES ON USE AND INTERPRETATION OF DATA PRODUCED BY STYLUS INSTRUMENTS
A-1 INTRODUCTION
A-2 ROUGHNESS AVERAGE
A-3 STYLUS TIP RADIUS
A-4 SKIDDED MEASUREMENTS
A-5 TRAVERSING LENGTH AND MEASUREMENT STATISTICS
A-6 FILTER CUTOFF SELECTION <\/td>\n<\/tr>\n
96<\/td>\nA-7 METHODS FOR ROUGHNESS AND WAVINESS SEPARATION <\/td>\n<\/tr>\n
97<\/td>\nNONMANDATORY APPENDIX B CONTROL AND PRODUCTION OF SURFACE TEXTURE
B-1 SPECIFICATION
B-2 PRODUCTION
B-3 INSPECTION <\/td>\n<\/tr>\n
98<\/td>\nFigure B-2-1 Surface Roughness Produced by Common Production Methods <\/td>\n<\/tr>\n
99<\/td>\nB-4 SURFACE TEXTURE OF CASTINGS
B-5 SURFACE TEXTURE OF PARTS FABRICATED BY ADDITIVE MANUFACTURING <\/td>\n<\/tr>\n
101<\/td>\nNONMANDATORY APPENDIX C A REVIEW OF ADDITIONAL SURFACE MEASUREMENT METHODS
C-1 INTRODUCTION
C-2 OPTICAL METHODS <\/td>\n<\/tr>\n
102<\/td>\nFigure C-2.2-1 Schmaltz Profile Microscope
Figure C-2.3-1 Reflectance Measurement <\/td>\n<\/tr>\n
103<\/td>\nFigure C-2.4-1 Schematic Diagram of Circular Path Profiler
Figure C-2.5-1 Multiple-Beam Interferometer <\/td>\n<\/tr>\n
104<\/td>\nFigure C-2.6-1 Differential Interference Contrast Photograph of Automobile Engine Cylinder Wall
Figure C-2.7-1 Differential Interferometry
C-3 REPLICAS <\/td>\n<\/tr>\n
105<\/td>\nFigure C-3-1 Zehender Method
Figure C-4.1-1 Comparison of Optical and Transmission Electron Microscopes
C-4 ELECTRON MICROSCOPE METHODS <\/td>\n<\/tr>\n
106<\/td>\nFigure C-4.2-1 Diagram of Scanning Electron Microscope
C-5 SURFACE EXAMINATION REFERENCES <\/td>\n<\/tr>\n
108<\/td>\nFigure D-2.1-1 Average Peak-to-Valley Roughness
NONMANDATORY APPENDIX D ADDITIONAL PARAMETERS FOR SURFACE CHARACTERIZATION
D-1 INTRODUCTION
D-2 INTERNATIONAL STANDARDS AND PARAMETERS
D-3 AUTOCOVARIANCE FUNCTION (ACV)
D-4 UNIFORMITY OF SURFACE <\/td>\n<\/tr>\n
109<\/td>\nFigure D-2.2-1 Average Spacing of Roughness Peaks
Figure D-2.3-1 Swedish Height of Irregularities
D-5 GENERAL REFERENCES ON SURFACE TEXTURE MEASUREMENTS <\/td>\n<\/tr>\n
110<\/td>\nFigure D-3-1 Measured Profiles and Their Autocorrelation Functions <\/td>\n<\/tr>\n
111<\/td>\nNONMANDATORY APPENDIX E CHARACTERISTICS OF CERTAIN AREA PROFILING METHODS
E-1 INTRODUCTION
E-2 IMAGING METHODS
E-3 SCANNING METHODS <\/td>\n<\/tr>\n
112<\/td>\nFigure E-3.1.1-1 Schematic Diagram of an Optical Focus-Sensing Instrument <\/td>\n<\/tr>\n
113<\/td>\nFigure E-3.2.1-1 Schematic Diagram of Nomarski Differential Profiler <\/td>\n<\/tr>\n
114<\/td>\nFigure E-3.3.1-1 Area Scanning Stylus Profiler <\/td>\n<\/tr>\n
115<\/td>\nFigure E-3.4.1-1 Basic Structure of an Early STM <\/td>\n<\/tr>\n
116<\/td>\nFigure E-3.5.1-1 Schematic Diagram of an Atomic Force Microscope With an Optical Lever Sensor
E-4 REFERENCES <\/td>\n<\/tr>\n
117<\/td>\nFigure E-3.6-1 Schematic Diagram of a Confocal Microscope <\/td>\n<\/tr>\n
118<\/td>\nNONMANDATORY APPENDIX F DESCRIPTIONS OF AREA AVERAGING METHODS
F-1 PARALLEL PLATE CAPACITANCE (PPC)
F-2 TOTAL INTEGRATED SCATTER (TIS) <\/td>\n<\/tr>\n
119<\/td>\nFigure F-1-1 Comparison of Roughness Void Volumes
Figure F-1-2 Principle of Capacitance Between Parallel Plates
Figure F-2-1 Schematic Diagram of an Instrument for Measuring TIS
F-3 ANGLE RESOLVED SCATTER (ARS) <\/td>\n<\/tr>\n
120<\/td>\nFigure F-3-1 Schematic Diagram of an Instrument for Measuring ARS or BRDF
F-4 REFERENCES <\/td>\n<\/tr>\n
121<\/td>\nNONMANDATORY APPENDIX G OBSERVATIONS ON THE FILTERING OF SURFACE PROFILES
G-1 INTRODUCTION
G-2 DIGITAL INSTRUMENTS <\/td>\n<\/tr>\n
123<\/td>\nNONMANDATORY APPENDIX H REFERENCE SUBROUTINES
H-1 INTRODUCTION
H-2 REFERENCE
H-3 SOURCE CODE
H-4 SUBROUTINES <\/td>\n<\/tr>\n
124<\/td>\nFigure H-4-1 Subroutines <\/td>\n<\/tr>\n
131<\/td>\nNONMANDATORY APPENDIX I A COMPARISON OF ASME AND ISO SURFACE TEXTURE PARAMETERS <\/td>\n<\/tr>\n
132<\/td>\nTable I-1 ASME B46.1-2019 Parameters <\/td>\n<\/tr>\n
134<\/td>\nTable J-1 Reference Standards
NONMANDATORY APPENDIX J FUNCTIONAL STANDARDS <\/td>\n<\/tr>\n
135<\/td>\nNONMANDATORY APPENDIX K SUGGESTED TERMINOLOGY AND PROCEDURES FOR THE EVALUATION OF FUNCTIONAL CORRELATIONS OF SURFACE TEXTURES WITH PROCESSING AND PERFORMANCE
K-1 GENERAL
K-2 DEFINITIONS RELATIVE TO FUNCTIONAL CORRELATIONS <\/td>\n<\/tr>\n
136<\/td>\nTable K-3-1 Elements for Reporting a Functional Correlation
K-3 REPORT OF FUNCTIONAL CORRELATIONS <\/td>\n<\/tr>\n
137<\/td>\nK-4 EXAMPLES
K-5 REFERENCES
K-6 BIBLIOGRAPHY OF ARTICLES WITH FUNCTIONAL CORRELATIONS <\/td>\n<\/tr>\n
138<\/td>\nFigure K-4.1-1 Roughness, Rz, Versus Feed
Figure K-4.2-1 Mean Relative Areas Versus Scale, \u03bcm, From Surfaces Created With All Five Discharge Pulse Energies <\/td>\n<\/tr>\n
139<\/td>\nFigure K-4.2-2 Mean Area-Scale Fractal Complexities (Asfc) Versus Scale for All Pulse Energies <\/td>\n<\/tr>\n
140<\/td>\nFigure K-4.2-3 Multiscale Correlation Strengths of the First Kind <\/td>\n<\/tr>\n
141<\/td>\nFigure K-4.3-1 Example of Regression Analysis and a Strong Functional Correlation <\/td>\n<\/tr>\n
142<\/td>\nFigure K-4.3-2 Multiscale Correlation Strengths of the Second Kind <\/td>\n<\/tr>\n<\/table>\n","protected":false},"excerpt":{"rendered":"

ASME B46.1-2019: Surface Texture (Surface Roughness, Waviness, and Lay)<\/b><\/p>\n\n\n\n\n
Published By<\/td>\nPublication Date<\/td>\nNumber of Pages<\/td>\n<\/tr>\n
ASME<\/b><\/a><\/td>\n2019<\/td>\n145<\/td>\n<\/tr>\n<\/tbody>\n<\/table>\n","protected":false},"featured_media":248888,"template":"","meta":{"rank_math_lock_modified_date":false,"ep_exclude_from_search":false},"product_cat":[2643],"product_tag":[],"class_list":{"0":"post-248886","1":"product","2":"type-product","3":"status-publish","4":"has-post-thumbnail","6":"product_cat-asme","8":"first","9":"instock","10":"sold-individually","11":"shipping-taxable","12":"purchasable","13":"product-type-simple"},"_links":{"self":[{"href":"https:\/\/pdfstandards.shop\/wp-json\/wp\/v2\/product\/248886","targetHints":{"allow":["GET"]}}],"collection":[{"href":"https:\/\/pdfstandards.shop\/wp-json\/wp\/v2\/product"}],"about":[{"href":"https:\/\/pdfstandards.shop\/wp-json\/wp\/v2\/types\/product"}],"wp:featuredmedia":[{"embeddable":true,"href":"https:\/\/pdfstandards.shop\/wp-json\/wp\/v2\/media\/248888"}],"wp:attachment":[{"href":"https:\/\/pdfstandards.shop\/wp-json\/wp\/v2\/media?parent=248886"}],"wp:term":[{"taxonomy":"product_cat","embeddable":true,"href":"https:\/\/pdfstandards.shop\/wp-json\/wp\/v2\/product_cat?post=248886"},{"taxonomy":"product_tag","embeddable":true,"href":"https:\/\/pdfstandards.shop\/wp-json\/wp\/v2\/product_tag?post=248886"}],"curies":[{"name":"wp","href":"https:\/\/api.w.org\/{rel}","templated":true}]}}