{"id":302314,"date":"2024-10-19T20:39:08","date_gmt":"2024-10-19T20:39:08","guid":{"rendered":"https:\/\/pdfstandards.shop\/product\/uncategorized\/bsi-pd-iso-tr-181962016\/"},"modified":"2024-10-25T18:09:53","modified_gmt":"2024-10-25T18:09:53","slug":"bsi-pd-iso-tr-181962016","status":"publish","type":"product","link":"https:\/\/pdfstandards.shop\/product\/publishers\/bsi\/bsi-pd-iso-tr-181962016\/","title":{"rendered":"BSI PD ISO\/TR 18196:2016"},"content":{"rendered":"

PDF Catalog<\/h4>\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n
PDF Pages<\/th>\nPDF Title<\/th>\n<\/tr>\n
10<\/td>\nForeword <\/td>\n<\/tr>\n
11<\/td>\nIntroduction <\/td>\n<\/tr>\n
13<\/td>\n1 Scope
2 Normative references
3 Terms and definitions
3.1 General terms <\/td>\n<\/tr>\n
14<\/td>\n3.2 Nano-object parameters <\/td>\n<\/tr>\n
15<\/td>\n4 Parameters included in the matrix <\/td>\n<\/tr>\n
17<\/td>\n5 Measurement techniques included in the matrix
5.1 General
5.2 Acoustic spectroscopy
5.2.1 Description <\/td>\n<\/tr>\n
18<\/td>\n5.2.2 Nano-object parameters
5.2.3 Advantages
5.2.4 Limitations
5.2.5 Measurand
5.2.6 Relevant standards
5.3 Analytical centrifugation (AC)
5.3.1 Description <\/td>\n<\/tr>\n
19<\/td>\n5.3.2 Nano-object parameters
5.3.3 Advantages
5.3.4 Limitations
5.3.5 Measurand
5.3.6 Relevant standards
5.4 Electroacoustic spectroscopy
5.4.1 Description
5.4.2 Nano-object parameters <\/td>\n<\/tr>\n
20<\/td>\n5.4.3 Advantages
5.4.4 Limitations
5.4.5 Measurand
5.4.6 Relevant standards
5.5 Aerosol particle mass analyser (AMS)
5.5.1 Description <\/td>\n<\/tr>\n
21<\/td>\n5.5.2 Nano-object parameters
5.5.3 Advantages
5.5.4 Limitations
5.5.5 Measurand
5.5.6 Relevant standards
5.6 Auger electron spectroscopy (AES)
5.6.1 Description
5.6.2 Nano-object parameters <\/td>\n<\/tr>\n
22<\/td>\n5.6.3 Advantages
5.6.4 Limitations
5.6.5 Measurand
5.6.6 Relevant standards
5.7 Brunauer-Emmett-Teller (BET) method for physical adsorption\u00a0\u2014 Surface area determination
5.7.1 Description <\/td>\n<\/tr>\n
23<\/td>\n5.7.2 Nano-object parameters
5.7.3 Advantages
5.7.4 Limitations
5.7.5 Measurand
5.7.6 Relevant standards
5.8 Condensation particle counter (CPC)
5.8.1 Description <\/td>\n<\/tr>\n
24<\/td>\n5.8.2 Nano-object parameters
5.8.3 Advantages
5.8.4 Limitations
5.8.5 Measurand
5.8.6 Relevant standards
5.9 Differential mobility analysis system (DMAS)
5.9.1 Description <\/td>\n<\/tr>\n
25<\/td>\n5.9.2 Nano-object parameters
5.9.3 Advantages
5.9.4 Limitations
5.9.5 Measurand
5.9.6 Relevant standards
5.10 Differential scanning calorimetry (DSC)
5.10.1 Description
5.10.2 Nano-object parameters
5.10.3 Advantages <\/td>\n<\/tr>\n
26<\/td>\n5.10.4 Limitations
5.10.5 Measurand
5.10.6 Relevant standards
5.11 Dynamic light scattering (DLS)
5.11.1 Description <\/td>\n<\/tr>\n
27<\/td>\n5.11.2 Nano-object parameters
5.11.3 Advantages
5.11.4 Limitations
5.11.5 Measurand
5.11.6 Relevant standards <\/td>\n<\/tr>\n
28<\/td>\n5.12 Electron energy loss spectroscopy (transmission EELS)
5.12.1 Description
5.12.2 Nano-object parameters
5.12.3 Advantages
5.12.4 Limitations
5.12.5 Measurand
5.12.6 Relevant standards
5.13 Electrophoresis\/capillary electrophoresis
5.13.1 Description <\/td>\n<\/tr>\n
30<\/td>\n5.13.2 Nano-object parameters
5.13.3 Advantages
5.13.4 Limitations
5.13.5 Measurands
5.13.6 Relevant standards
5.14 Energy dispersive X-ray spectrometry (EDS\/EDX and WDS)
5.14.1 Description
5.14.2 Nano-object parameters <\/td>\n<\/tr>\n
31<\/td>\n5.14.3 Advantages
5.14.4 Limitations
5.14.5 Measurand
5.14.6 Relevant standards
5.15 Field flow fractionation (FFF)
5.15.1 Description
5.15.2 Nano-object parameters <\/td>\n<\/tr>\n
32<\/td>\n5.15.3 Advantages
5.15.4 Limitations
5.15.5 Measurand
5.15.6 Relevant standards
5.16 Fluorescence spectroscopy
5.16.1 Description
5.16.2 Nano-object parameters
5.16.3 Advantages <\/td>\n<\/tr>\n
33<\/td>\n5.16.4 Limitations
5.16.5 Measurand
5.16.6 Relevant standards
5.17 Fourier transform infrared (FT-IR) spectroscopy and FT-IR imaging
5.17.1 Description
5.17.2 Nano-object parameters
5.17.3 Advantages <\/td>\n<\/tr>\n
34<\/td>\n5.17.4 Limitations
5.17.5 Measurand
5.17.6 Relevant standards for FT-IR
5.18 Induced grating method (IG)
5.18.1 Description
5.18.2 Nano-object parameters
5.18.3 Advantages
5.18.4 Limitations <\/td>\n<\/tr>\n
35<\/td>\n5.18.5 Measurand
5.18.6 Relevant standards
5.19 Inductively coupled plasma\u2013mass spectrometry (ICP-MS) and single particle inductively coupled plasma\u2013mass spectrometry (SP-ICP-MS)
5.19.1 Description
5.19.2 Nano-object parameters
5.19.3 Advantages
5.19.4 Limitations <\/td>\n<\/tr>\n
36<\/td>\n5.19.5 Measurand
5.19.6 Relevant standards
5.19.7 Nano-hyphenated ICP\/MS techniques <\/td>\n<\/tr>\n
37<\/td>\n5.20 Laser diffraction
5.20.1 Description
5.20.2 Nano-object parameters
5.20.3 Advantages
5.20.4 Limitations
5.20.5 Measurand
5.20.6 Relevant standards <\/td>\n<\/tr>\n
38<\/td>\n5.21 Liquid chromatography\u2013mass spectrometry (LC-MS)
5.21.1 Description
5.21.2 Nano-object parameters
5.21.3 Advantages
5.21.4 Limitations
5.21.5 Measurand
5.21.6 Relevant standards
5.22 Particle tracking analysis (PTA)
5.22.1 Description <\/td>\n<\/tr>\n
39<\/td>\n5.22.2 Nano-object parameters
5.22.3 Advantages
5.22.4 Limitations
5.22.5 Measurand <\/td>\n<\/tr>\n
40<\/td>\n5.22.6 Relevant standards
5.23 Optical absorption spectroscopy (UV\/Vis\/NIR)
5.23.1 Description
5.23.2 Nano-object parameters
5.23.3 Advantages
5.23.4 Limitations <\/td>\n<\/tr>\n
41<\/td>\n5.23.5 Measurand
5.23.6 Relevant standards for
5.24 Quartz crystal microbalance (QCM)
5.24.1 Description
5.24.2 Nano-object parameters
5.24.3 Advantages
5.24.4 Limitations
5.24.5 Measurand
5.24.6 Relevant standards <\/td>\n<\/tr>\n
42<\/td>\n5.25 Raman spectroscopy\/Raman imaging
5.25.1 Description
5.25.2 Nano-object parameters
5.25.3 Advantages
5.25.4 Limitations
5.25.5 Measurand
5.25.6 Relevant standards for Raman <\/td>\n<\/tr>\n
43<\/td>\n5.26 Resonant mass measurement (RMM)
5.26.1 Description
5.26.2 Nano-object parameters
5.26.3 Advantages
5.26.4 Limitations
5.26.5 Measurand
5.26.6 Relevant standards
5.27 Scanning electron microscopy (SEM)
5.27.1 Description <\/td>\n<\/tr>\n
44<\/td>\n5.27.2 Nano-objects parameters
5.27.3 Advantages
5.27.4 Limitations <\/td>\n<\/tr>\n
45<\/td>\n5.27.5 Measurand
5.27.6 Relevant standards
5.28 Scanning probe microscopy (SPM)
5.28.1 Description <\/td>\n<\/tr>\n
46<\/td>\n5.28.2 Nano-object parameters
5.28.3 Advantages
5.28.4 Limitations <\/td>\n<\/tr>\n
47<\/td>\n5.28.5 Measurand(s)
5.28.6 Relevant standards
5.29 Secondary ion mass spectrometry (SIMS) and Time of Flight SIMS (TOF-SIMS)
5.29.1 Description
5.29.2 Nano-object parameters
5.29.3 Advantages <\/td>\n<\/tr>\n
48<\/td>\n5.29.4 Limitations
5.29.5 Measurand
5.29.6 Relevant standards
5.30 Small angle X-ray scattering (SAXS)
5.30.1 Description
5.30.2 Nano-object parameters <\/td>\n<\/tr>\n
49<\/td>\n5.30.3 Advantages
5.30.4 Limitations
5.30.5 Measurand <\/td>\n<\/tr>\n
50<\/td>\n5.30.6 Relevant standards
5.31 Static light scattering (SLS) and static multiple light scattering (SMLS)
5.31.1 Description
5.31.2 Nano-object parameters
5.31.3 Advantages <\/td>\n<\/tr>\n
51<\/td>\n5.31.4 Limitations
5.31.5 Measurands (SLS)
5.31.6 Measurands (SMLS)
5.31.7 Relevant standards
5.32 Single particle light interaction methods
5.32.1 Description <\/td>\n<\/tr>\n
52<\/td>\n5.32.2 Nano-object parameters
5.32.3 Advantages
5.32.4 Limitations
5.32.5 Measurand
5.32.6 Relevant standards
5.33 Thermogravimetric analysis (TGA)
5.33.1 Description
5.33.2 Nano-object parameters
5.33.3 Advantages <\/td>\n<\/tr>\n
53<\/td>\n5.33.4 Limitations
5.33.5 Measurand
5.33.6 Relevant standards
5.33.7 Hyphenated TGA techniques
5.34 Transmission electron microscopy (TEM)
5.34.1 Description
5.34.2 Nano-object parameters <\/td>\n<\/tr>\n
54<\/td>\n5.34.3 Advantages
5.34.4 Limitations
5.34.5 Measurand
5.34.6 Relevant standards <\/td>\n<\/tr>\n
55<\/td>\n5.35 X-ray diffraction (XRD)
5.35.1 Description
5.35.2 Nano-object parameters
5.35.3 Advantages
5.35.4 Limitations
5.35.5 Measurand
5.35.6 Relevant standards <\/td>\n<\/tr>\n
56<\/td>\n5.36 X-ray photoelectron spectroscopy (XPS)
5.36.1 Description
5.36.2 Nano-object parameters
5.36.3 Advantages
5.36.4 Limitations
5.36.5 Measurand
5.36.6 Relevant standards <\/td>\n<\/tr>\n
58<\/td>\nAnnex\u00a0A (informative) Sample separation\/preparation <\/td>\n<\/tr>\n
61<\/td>\nBibliography <\/td>\n<\/tr>\n<\/table>\n","protected":false},"excerpt":{"rendered":"

Nanotechnologies. Measurement technique matrix for the characterization of nano-objects<\/b><\/p>\n\n\n\n\n
Published By<\/td>\nPublication Date<\/td>\nNumber of Pages<\/td>\n<\/tr>\n
BSI<\/b><\/a><\/td>\n2017<\/td>\n68<\/td>\n<\/tr>\n<\/tbody>\n<\/table>\n","protected":false},"featured_media":302318,"template":"","meta":{"rank_math_lock_modified_date":false,"ep_exclude_from_search":false},"product_cat":[2641],"product_tag":[],"class_list":{"0":"post-302314","1":"product","2":"type-product","3":"status-publish","4":"has-post-thumbnail","6":"product_cat-bsi","8":"first","9":"instock","10":"sold-individually","11":"shipping-taxable","12":"purchasable","13":"product-type-simple"},"_links":{"self":[{"href":"https:\/\/pdfstandards.shop\/wp-json\/wp\/v2\/product\/302314","targetHints":{"allow":["GET"]}}],"collection":[{"href":"https:\/\/pdfstandards.shop\/wp-json\/wp\/v2\/product"}],"about":[{"href":"https:\/\/pdfstandards.shop\/wp-json\/wp\/v2\/types\/product"}],"wp:featuredmedia":[{"embeddable":true,"href":"https:\/\/pdfstandards.shop\/wp-json\/wp\/v2\/media\/302318"}],"wp:attachment":[{"href":"https:\/\/pdfstandards.shop\/wp-json\/wp\/v2\/media?parent=302314"}],"wp:term":[{"taxonomy":"product_cat","embeddable":true,"href":"https:\/\/pdfstandards.shop\/wp-json\/wp\/v2\/product_cat?post=302314"},{"taxonomy":"product_tag","embeddable":true,"href":"https:\/\/pdfstandards.shop\/wp-json\/wp\/v2\/product_tag?post=302314"}],"curies":[{"name":"wp","href":"https:\/\/api.w.org\/{rel}","templated":true}]}}