{"id":397258,"date":"2024-10-20T04:29:13","date_gmt":"2024-10-20T04:29:13","guid":{"rendered":"https:\/\/pdfstandards.shop\/product\/uncategorized\/ieee-1671-5-2008-3\/"},"modified":"2024-10-26T08:16:46","modified_gmt":"2024-10-26T08:16:46","slug":"ieee-1671-5-2008-3","status":"publish","type":"product","link":"https:\/\/pdfstandards.shop\/product\/publishers\/ieee\/ieee-1671-5-2008-3\/","title":{"rendered":"IEEE 1671.5-2008"},"content":{"rendered":"
New IEEE Standard – Superseded. An exchange format, utilizing XML, for identifying all of the hardware, software, and documentation associated with a test station is specified in this document. This test station may be used as a component of a test program set to test and diagnose a unit under test.<\/p>\n
PDF Pages<\/th>\n | PDF Title<\/th>\n<\/tr>\n | ||||||
---|---|---|---|---|---|---|---|
1<\/td>\n | IEEE Std 1671.5-2008 Front Cover <\/td>\n<\/tr>\n | ||||||
3<\/td>\n | Title Page <\/td>\n<\/tr>\n | ||||||
6<\/td>\n | Introduction <\/td>\n<\/tr>\n | ||||||
7<\/td>\n | Notice to users Laws and regulations Copyrights Updating of IEEE documents Errata Patents <\/td>\n<\/tr>\n | ||||||
9<\/td>\n | Participants <\/td>\n<\/tr>\n | ||||||
11<\/td>\n | Contents <\/td>\n<\/tr>\n | ||||||
13<\/td>\n | IMPORTANT NOTICE 1. Overview <\/td>\n<\/tr>\n | ||||||
14<\/td>\n | 1.1 Scope 1.2 Purpose 1.3 Application 1.4 Conventions used within this document <\/td>\n<\/tr>\n | ||||||
16<\/td>\n | 2. Normative references 3. Definitions, acronyms, and abbreviations 3.1 Definitions <\/td>\n<\/tr>\n | ||||||
17<\/td>\n | 3.2 Acronyms and abbreviations 4. Schema\u2014TestAdapterDescription.xsd 4.1 General <\/td>\n<\/tr>\n | ||||||
18<\/td>\n | 4.2 Elements <\/td>\n<\/tr>\n | ||||||
19<\/td>\n | 4.3 Child elements 4.4 Complex types 4.5 Inherited simple types 4.6 Inherited complex types <\/td>\n<\/tr>\n | ||||||
20<\/td>\n | 4.7 Inherited attribute groups 5. Schema\u2014TestAdapterInstance.xsd 5.1 General 5.2 Elements <\/td>\n<\/tr>\n | ||||||
21<\/td>\n | 5.3 Child elements 5.4 Complex types 5.5 Inherited simple types 5.6 Inherited complex types <\/td>\n<\/tr>\n | ||||||
22<\/td>\n | 5.7 Inherited attribute groups 6. Conformance 7. Extensibility <\/td>\n<\/tr>\n | ||||||
24<\/td>\n | Annex A (informative) TestAdapterDescription and TestAdapterInstance instance documents (.XML files) A.1 TestAdapterDescription <\/td>\n<\/tr>\n | ||||||
25<\/td>\n | A.2 TestAdapterInstance <\/td>\n<\/tr>\n | ||||||
26<\/td>\n | Annex B (informative) Users information and examples B.1 Interface test adapter <\/td>\n<\/tr>\n | ||||||
28<\/td>\n | Annex C (informative) Glossary <\/td>\n<\/tr>\n | ||||||
29<\/td>\n | Annex D (informative) Bibliography <\/td>\n<\/tr>\n<\/table>\n","protected":false},"excerpt":{"rendered":" IEEE Standard for Automatic Test Markup Language (ATML) for Exchanging Automatic Test Information via XML:Exchanging Test Adapter Information<\/b><\/p>\n |