{"id":420064,"date":"2024-10-20T06:29:07","date_gmt":"2024-10-20T06:29:07","guid":{"rendered":"https:\/\/pdfstandards.shop\/product\/uncategorized\/bsi-pd-iec-tr-62627-03-042013-2\/"},"modified":"2024-10-26T12:07:33","modified_gmt":"2024-10-26T12:07:33","slug":"bsi-pd-iec-tr-62627-03-042013-2","status":"publish","type":"product","link":"https:\/\/pdfstandards.shop\/product\/publishers\/bsi\/bsi-pd-iec-tr-62627-03-042013-2\/","title":{"rendered":"BSI PD IEC\/TR 62627-03-04:2013"},"content":{"rendered":"
This part of IEC 62627, which is a technical report, is a guideline for a procedure to evaluate the reliability of passive optical components under high power conditions. This guideline is one example to which the test results of IEC\/TR 62627 -03-02 and IEC\/TR 62627-03-03 may apply.<\/p>\n
PDF Pages<\/th>\n | PDF Title<\/th>\n<\/tr>\n | ||||||
---|---|---|---|---|---|---|---|
4<\/td>\n | CONTENTS <\/td>\n<\/tr>\n | ||||||
5<\/td>\n | FOREWORD <\/td>\n<\/tr>\n | ||||||
7<\/td>\n | INTRODUCTION <\/td>\n<\/tr>\n | ||||||
8<\/td>\n | 1 Scope 2 Normative references 3 Generic information <\/td>\n<\/tr>\n | ||||||
9<\/td>\n | 4 Procedures for confirmation of high power reliability 5 Risk analysis under high power conditions 5.1 Example of risk under high power conditions <\/td>\n<\/tr>\n | ||||||
10<\/td>\n | 5.2 Preparation of risk analysis table Table 1 \u2013 Typical risks of materials on high power input condition <\/td>\n<\/tr>\n | ||||||
11<\/td>\n | 5.3 Estimation of failure modes and determination of test conditions 6 Step-stress test 6.1 General 6.2 Test set-up Table 2 \u2013 Format of high power risk analysis table <\/td>\n<\/tr>\n | ||||||
12<\/td>\n | 6.3 Test condition 6.3.1 Duration time of step-stress test 6.3.2 Test temperature 6.3.3 Pass\/fail criteria 6.3.4 Performance monitoring 6.3.5 Test wavelengths of light source Figure 1 \u2013 Test set-up of high power step-stress test (example) <\/td>\n<\/tr>\n | ||||||
13<\/td>\n | 6.3.6 Test power 6.3.7 Sample size 6.3.8 Coherency of light source 7 Analysis of step-stress test result 7.1 Estimate and identify the failure mechanism 7.2 Estimate the maximum input power for guaranteeing long-term reliability <\/td>\n<\/tr>\n | ||||||
14<\/td>\n | 8 Long-term test 9 Reliability under high power conditions <\/td>\n<\/tr>\n | ||||||
15<\/td>\n | 10 Test report <\/td>\n<\/tr>\n | ||||||
16<\/td>\n | Annex A (informative) Examples of high power risk analysis table for optical passive components Table A.1 \u2013 High power risk analysis table for metal-doped, fibre plug-style fixed optical attenuators Table A.2 \u2013 High power risk analysis table for in-line optical isolators <\/td>\n<\/tr>\n | ||||||
17<\/td>\n | Table A.3 \u2013 High power risk analysis table for planer waveguide type optical splitters <\/td>\n<\/tr>\n<\/table>\n","protected":false},"excerpt":{"rendered":" Fibre optic interconnecting devices and passive components – Reliability. Guideline for high power reliability of passive optical components<\/b><\/p>\n |