This part of IEC 62396 is intended to provide awareness and guidance with regard to the effects of small particles (that is, protons, electrons, pions and muon fluxes) and single event effects on avionics electronics used in aircraft operating at altitudes up to 60 000 feet (18 300 m). This is an emerging topic and lacks substantive supporting data. This document is intended to help aerospace or ground level electronic equipment manufacturers and designers by providing awareness guidance for this new emerging topic.<\/p>\n
Details of the radiation environment are provided together with identification of potential problems caused as a result of the atmospheric radiation received. Appropriate methods are given for quantifying single event effect (SEE) rates in electronic components.<\/p>\n
\nNOTE 1 The overall system safety methodology is usually expanded to accommodate the single event effects rates and to demonstrate the suitability of the electronics for application at the electronic component, electronic equipment and system level.<\/p>\n<\/blockquote>\n
\nNOTE 2 For the purposes of this document the terms “electronic device” and “electronic component” are used interchangeably.<\/p>\n<\/blockquote>\n
Although developed for the avionics industry, this document can be used by other industrial sectors at their discretion.<\/p>\n
PDF Catalog<\/h4>\n
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\n PDF Pages<\/th>\n PDF Title<\/th>\n<\/tr>\n \n 2<\/td>\n undefined <\/td>\n<\/tr>\n \n 4<\/td>\n CONTENTS <\/td>\n<\/tr>\n \n 7<\/td>\n FOREWORD <\/td>\n<\/tr>\n \n 9<\/td>\n INTRODUCTION <\/td>\n<\/tr>\n \n 10<\/td>\n 1 Scope
2 Normative references
3 Terms, definitions, abbreviated terms and acronyms <\/td>\n<\/tr>\n\n 11<\/td>\n 3.1 Terms and definitions <\/td>\n<\/tr>\n \n 12<\/td>\n 3.2 Abbreviated terms and acronyms <\/td>\n<\/tr>\n \n 14<\/td>\n 4 Technical awareness
4.1 Basic knowledge of atmospheric secondary particles <\/td>\n<\/tr>\n\n 15<\/td>\n Figures
Figure 1 \u2013 Cosmic rays as origin of single event effects <\/td>\n<\/tr>\n\n 16<\/td>\n Figure 2 \u2013 Initial stage of secondary particle production
Figure 3 \u2013 Differential high-energy neutron spectrum at sea level in NYC <\/td>\n<\/tr>\n\n 17<\/td>\n 4.2 Four typical hierarchies of faulty conditions in electronic equipment: Fault \u2013 error \u2013 hazard \u2013 failure
Figure 4 \u2013 Long-term cyclic variation in neutron flux measuredat Moscow Neutron Monitor Center
Figure 5 \u2013 Differential proton spectra originating from solar-minimum sun,from big flares on the sun, and from the galactic core <\/td>\n<\/tr>\n\n 19<\/td>\n Tables
Table 1 \u2013 General modes of faults <\/td>\n<\/tr>\n\n 20<\/td>\n 4.3 General sources of radiation
4.3.1 General sources of terrestrial radiation
Figure 6 \u2013 Typical hierarchy of fault conditions: Fault-error-failure <\/td>\n<\/tr>\n\n 21<\/td>\n 4.3.2 Atmospheric radiation particles
Figure 7 \u2013 Sources of atmospheric ionizing radiation:Nuclear reactions and radioactive decay
Table 2 \u2013 Properties of atmospheric radiation particles <\/td>\n<\/tr>\n\n 24<\/td>\n 4.3.3 Spectra at the avionics altitude
Figure 8 \u2013 Differential flux of secondary cosmic raysat avionics altitude (10 000 m) above NYC sea level
Table 3 \u2013 Selected data sources for spectra of atmospheric radiation particles <\/td>\n<\/tr>\n\n 25<\/td>\n Figure 9 \u2013 Differential flux of terrestrial radiation at NYC sea level <\/td>\n<\/tr>\n \n 26<\/td>\n Figure 10 \u2013 Measured differential flux of high-energy neutrons at NYC sea leveland at avionics altitudes (5 000 m, 11 000 m and 20 000 m) <\/td>\n<\/tr>\n \n 27<\/td>\n 4.4 Particle considerations
4.4.1 General
4.4.2 Alpha particles
Figure 11 \u2013 Cumulative flux of terrestrial radiation at avionicsaltitude above NYC sea level <\/td>\n<\/tr>\n\n 28<\/td>\n 4.4.3 Protons
Table 4 \u2013 Non-exhaustive list of methods for alpha-particle SEE measurements <\/td>\n<\/tr>\n\n 29<\/td>\n Figure 12 \u2013 Comparison of measured cross section of memorydevices irradiated by high-energy protons and neutrons
Table 5 \u2013 Non-exhaustive list of facilities for proton irradiation <\/td>\n<\/tr>\n\n 32<\/td>\n 4.4.4 Muons and pions
Figure 13 \u2013 Simplified scheme ofmuon\/pion irradiation system <\/td>\n<\/tr>\n\n 33<\/td>\n Table 6 \u2013 Non-exhaustive list of facilities for muon irradiation <\/td>\n<\/tr>\n \n 34<\/td>\n 4.4.5 Low-energy neutrons
Figure 14 \u2013 Nuclear capture of cross section of cadmium isotopes <\/td>\n<\/tr>\n\n 35<\/td>\n 4.4.6 High-energy neutrons
Table 7 \u2013 Non-exhaustive list of facilities for thermal\/epi-thermal neutron irradiation <\/td>\n<\/tr>\n\n 37<\/td>\n Figure 15 \u2013 Neutron energy spectra of monoenergetic neutron beam facilities
Figure 16 \u2013 Neutron energy spectra fromradioisotope neutron sources <\/td>\n<\/tr>\n\n 38<\/td>\n Table 8 \u2013 Non-exhaustive list of facilities for low-energy neutron irradiation <\/td>\n<\/tr>\n \n 39<\/td>\n Figure 17 \u2013 Simplified high-energy neutron beam sourcein a quasi-monoenergetic neutron source <\/td>\n<\/tr>\n \n 40<\/td>\n Figure 18 \u2013 Neutron energy spectra of quasi-monoenergetic neutron beam facilities <\/td>\n<\/tr>\n \n 41<\/td>\n Figure 19 \u2013 Conceptual illustration of cross section data obtained by (quasi-) monoenergetic neutron sources and fitting curve by Weibull fit <\/td>\n<\/tr>\n \n 42<\/td>\n Table 9 \u2013 Non-exhaustive list of facilities for quasi-monoenergetic neutron irradiation <\/td>\n<\/tr>\n \n 43<\/td>\n Figure 20 \u2013 Simplified high-energy neutron beam source in a spallation neutron source <\/td>\n<\/tr>\n \n 44<\/td>\n Figure 21 \u2013 Neutron energy spectra of spallation neutron sources and terrestrial field
Table 10 \u2013 Non-exhaustive list of facilities for nuclear spallation neutron irradiation <\/td>\n<\/tr>\n\n 45<\/td>\n 4.5 Conclusion and guidelines <\/td>\n<\/tr>\n \n 47<\/td>\n Annex A (informative)CMOS semiconductor devices
Figure A.1 \u2013 Basic substrate structure used for CMOSFET devices on the stripe structure of p- and n-wells and cross sections of triple and dual wells <\/td>\n<\/tr>\n\n 48<\/td>\n Figure A.2 \u2013 SRAM function and layout
Figure A.3 \u2013 Example of logic circuit <\/td>\n<\/tr>\n\n 49<\/td>\n Figure A.4 \u2013 Example of electronic system implementation
Figure A.5 \u2013 Example of stack layers in an electronic system <\/td>\n<\/tr>\n\n 50<\/td>\n Annex B (informative)General description of radiation effects
B.1 Radiation effects in semiconductor materials by a charged particle \u2013 Charge collection and bipolar action
Figure B.1 \u2013 Charge collection in a semiconductor structure by funnelling <\/td>\n<\/tr>\n\n 51<\/td>\n B.2 Radiation effects by protons
Figure B.2 \u2013 Bipolar action model in a triple well n-MOSFET structure <\/td>\n<\/tr>\n\n 52<\/td>\n Figure B.3 \u2013 Charge deposition density of various particles in siliconas a function of particle energy
Figure B.4 \u2013 Total nuclear reaction cross section of high-energyproton and neutron in silicon <\/td>\n<\/tr>\n\n 53<\/td>\n B.3 Radiation effects by low-energy neutrons
Figure B.5 \u2013 Microscopic fault mechanism due to spallation reactionof high-energy neutron and proton in a SRAM cell <\/td>\n<\/tr>\n\n 54<\/td>\n B.4 Radiation effects by high-energy neutrons
Figure B.6 \u2013 (n,\u03b1) reaction cross section of low-energy neutrons with 10B
Figure B.7 \u2013 Calculated energy spectra of Li and He producedby neutron capture reaction with 10B(n,\u03b1)7Li reaction <\/td>\n<\/tr>\n\n 55<\/td>\n B.5 Radiation effects by heavy ions
Figure B.8 \u2013 Ranges of typical isotopes produced by nuclearspallation reaction of high-energy neutron in silicon
Figure B.9 \u2013 Calculated energy spectra of elements produced by nuclear spallation reaction of high-energy neutrons in silicon at Tokyo sea level <\/td>\n<\/tr>\n<\/table>\n","protected":false},"excerpt":{"rendered":"Process management for avionics. Atmospheric radiation effects – Proton, electron, pion, muon, alpha-ray fluxes and single event effects in avionics electronic equipment. Awareness guidelines<\/b><\/p>\n
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\n Published By<\/td>\n Publication Date<\/td>\n Number of Pages<\/td>\n<\/tr>\n \n BSI<\/b><\/a><\/td>\n 2020<\/td>\n 62<\/td>\n<\/tr>\n<\/tbody>\n<\/table>\n","protected":false},"featured_media":421510,"template":"","meta":{"rank_math_lock_modified_date":false,"ep_exclude_from_search":false},"product_cat":[89,2641],"product_tag":[],"class_list":{"0":"post-421499","1":"product","2":"type-product","3":"status-publish","4":"has-post-thumbnail","6":"product_cat-03-100-50","7":"product_cat-bsi","9":"first","10":"instock","11":"sold-individually","12":"shipping-taxable","13":"purchasable","14":"product-type-simple"},"_links":{"self":[{"href":"https:\/\/pdfstandards.shop\/wp-json\/wp\/v2\/product\/421499","targetHints":{"allow":["GET"]}}],"collection":[{"href":"https:\/\/pdfstandards.shop\/wp-json\/wp\/v2\/product"}],"about":[{"href":"https:\/\/pdfstandards.shop\/wp-json\/wp\/v2\/types\/product"}],"wp:featuredmedia":[{"embeddable":true,"href":"https:\/\/pdfstandards.shop\/wp-json\/wp\/v2\/media\/421510"}],"wp:attachment":[{"href":"https:\/\/pdfstandards.shop\/wp-json\/wp\/v2\/media?parent=421499"}],"wp:term":[{"taxonomy":"product_cat","embeddable":true,"href":"https:\/\/pdfstandards.shop\/wp-json\/wp\/v2\/product_cat?post=421499"},{"taxonomy":"product_tag","embeddable":true,"href":"https:\/\/pdfstandards.shop\/wp-json\/wp\/v2\/product_tag?post=421499"}],"curies":[{"name":"wp","href":"https:\/\/api.w.org\/{rel}","templated":true}]}}