{"id":421681,"date":"2024-10-20T06:37:33","date_gmt":"2024-10-20T06:37:33","guid":{"rendered":"https:\/\/pdfstandards.shop\/product\/uncategorized\/bsi-pd-iec-tr-631332017-2\/"},"modified":"2024-10-26T12:23:57","modified_gmt":"2024-10-26T12:23:57","slug":"bsi-pd-iec-tr-631332017-2","status":"publish","type":"product","link":"https:\/\/pdfstandards.shop\/product\/publishers\/bsi\/bsi-pd-iec-tr-631332017-2\/","title":{"rendered":"BSI PD IEC\/TR 63133:2017"},"content":{"rendered":"

This Technical Report specifies a design technique of performance estimation storage element, which can monitor semiconductor ageing and characterize ageing level. The estimated ageing level can be used to improve the reliability of system.<\/p>\n

PDF Catalog<\/h4>\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n
PDF Pages<\/th>\nPDF Title<\/th>\n<\/tr>\n
2<\/td>\nundefined <\/td>\n<\/tr>\n
4<\/td>\nCONTENTS <\/td>\n<\/tr>\n
5<\/td>\nFOREWORD <\/td>\n<\/tr>\n
7<\/td>\nINTRODUCTION
Figures
Figure 1 \u2013 Reliability bathtub curve <\/td>\n<\/tr>\n
8<\/td>\n1 Scope
2 Normative references
3 Terms, definitions and abbreviated terms
3.1 Terms and definitions <\/td>\n<\/tr>\n
9<\/td>\n3.2 Abbreviations <\/td>\n<\/tr>\n
11<\/td>\n4 Ageing level
4.1 Overview
4.2 Ageing level characterization technique (test method)
Figure 2 \u2013 Schematic of ageing level estimation technique <\/td>\n<\/tr>\n
12<\/td>\nFigure 3 \u2013 A guard band and estimated ageing level <\/td>\n<\/tr>\n
13<\/td>\n4.3 Architecture and operation
Figure 4 \u2013 Ageing level monitoring and scan chain architecture <\/td>\n<\/tr>\n
14<\/td>\n4.4 Performance estimation storage element
Figure 5 \u2013 State diagram for performance estimation controller <\/td>\n<\/tr>\n
15<\/td>\nFigure 6 \u2013 Modified scan cell architecture
Figure 7 \u2013 Operations of shadow latch, storage element, and PERCaccording to CLK and PECLK <\/td>\n<\/tr>\n
16<\/td>\n4.5 Simulation results
4.6 Experimental results
Figure 8 \u2013 Simulation results for a case in which ageing occurs on a data path <\/td>\n<\/tr>\n
17<\/td>\nTable 1 \u2013 Power consumption compared with prior work <\/td>\n<\/tr>\n
18<\/td>\nFigure 9 \u2013 PECLKs for various delay points and their results <\/td>\n<\/tr>\n
19<\/td>\nBibliography <\/td>\n<\/tr>\n<\/table>\n","protected":false},"excerpt":{"rendered":"

Semiconductor devices. Scan based ageing level estimation for semiconductor devices<\/b><\/p>\n\n\n\n\n
Published By<\/td>\nPublication Date<\/td>\nNumber of Pages<\/td>\n<\/tr>\n
BSI<\/b><\/a><\/td>\n2018<\/td>\n20<\/td>\n<\/tr>\n<\/tbody>\n<\/table>\n","protected":false},"featured_media":421691,"template":"","meta":{"rank_math_lock_modified_date":false,"ep_exclude_from_search":false},"product_cat":[573,2641],"product_tag":[],"class_list":{"0":"post-421681","1":"product","2":"type-product","3":"status-publish","4":"has-post-thumbnail","6":"product_cat-31-080-01","7":"product_cat-bsi","9":"first","10":"instock","11":"sold-individually","12":"shipping-taxable","13":"purchasable","14":"product-type-simple"},"_links":{"self":[{"href":"https:\/\/pdfstandards.shop\/wp-json\/wp\/v2\/product\/421681","targetHints":{"allow":["GET"]}}],"collection":[{"href":"https:\/\/pdfstandards.shop\/wp-json\/wp\/v2\/product"}],"about":[{"href":"https:\/\/pdfstandards.shop\/wp-json\/wp\/v2\/types\/product"}],"wp:featuredmedia":[{"embeddable":true,"href":"https:\/\/pdfstandards.shop\/wp-json\/wp\/v2\/media\/421691"}],"wp:attachment":[{"href":"https:\/\/pdfstandards.shop\/wp-json\/wp\/v2\/media?parent=421681"}],"wp:term":[{"taxonomy":"product_cat","embeddable":true,"href":"https:\/\/pdfstandards.shop\/wp-json\/wp\/v2\/product_cat?post=421681"},{"taxonomy":"product_tag","embeddable":true,"href":"https:\/\/pdfstandards.shop\/wp-json\/wp\/v2\/product_tag?post=421681"}],"curies":[{"name":"wp","href":"https:\/\/api.w.org\/{rel}","templated":true}]}}