This Technical Report is an intercomparison supporting the development of IEC 61189-5-501 in relation to the SIR method. This document sets out to validate the introduction of a new 200-\u00b5m gap SIR pattern, and was benched marked against existing SIR gap patterns of 318 \u00b5m and 500 \u00b5m.<\/p>\n
| PDF Pages<\/th>\n | PDF Title<\/th>\n<\/tr>\n | ||||||
|---|---|---|---|---|---|---|---|
| 2<\/td>\n | undefined <\/td>\n<\/tr>\n | ||||||
| 4<\/td>\n | CONTENTS <\/td>\n<\/tr>\n | ||||||
| 6<\/td>\n | FOREWORD <\/td>\n<\/tr>\n | ||||||
| 8<\/td>\n | INTRODUCTION <\/td>\n<\/tr>\n | ||||||
| 9<\/td>\n | 1 Scope 2 Normative references 3 Terms and definitions 4 Test board concept for intercomparison 4.1 The need for a fine-pitch SIR pattern <\/td>\n<\/tr>\n | ||||||
| 10<\/td>\n | 4.2 Test board design <\/td>\n<\/tr>\n | ||||||
| 11<\/td>\n | 4.3 Test board fluxing Figures Figure 1 \u2013 TB144 Tables Table 1 \u2013 SIR pattern information <\/td>\n<\/tr>\n | ||||||
| 12<\/td>\n | 5 Test procedure for intercomparison 5.1 Sample preparation Table 2 \u2013 Flux to be used for SIR evaluation test Table 3 \u2013 Samples for SIR evaluation testing <\/td>\n<\/tr>\n | ||||||
| 13<\/td>\n | 5.2 Preparation of samples for humidity chamber 5.3 Placement of samples inside the humidity chamber Figure 2 \u2013 Connector arrangement <\/td>\n<\/tr>\n | ||||||
| 14<\/td>\n | 5.4 Resistance measurements 5.5 Evaluation of results 5.6 Additional information 6 Results Figure 3 \u2013 Sample orientation in test chamber <\/td>\n<\/tr>\n | ||||||
| 15<\/td>\n | Figure 4 \u2013 Participants’ (a to f) resistance measurements for the six test patterns on the checkerboard Figure 5 \u2013 Participant A control boards <\/td>\n<\/tr>\n | ||||||
| 16<\/td>\n | Figure 6 \u2013 Participant A flux loaded boards Figure 7 \u2013 Participant B control boards Figure 8 \u2013 Participant B flux loaded boards <\/td>\n<\/tr>\n | ||||||
| 17<\/td>\n | Figure 9 \u2013 Participant C control boards Figure 10 \u2013 Participant C flux loaded boards Figure 11 \u2013 Participant D control boards <\/td>\n<\/tr>\n | ||||||
| 18<\/td>\n | Figure 12 \u2013 Participant D flux loaded boards Figure 13 \u2013 Participant E control boards Figure 14 \u2013 Participant E flux loaded boards <\/td>\n<\/tr>\n | ||||||
| 19<\/td>\n | Figure 15 \u2013 Participant F control boards Figure 16 \u2013 Participant F flux loaded boards Figure 17 \u2013 Participant G control boards <\/td>\n<\/tr>\n | ||||||
| 20<\/td>\n | Figure 18 \u2013 Participant G flux loaded boards Figure 19 \u2013 Participant D, and evidence of a fibre and the effect on the SIR Figure 20 \u2013 Participant E and evidence of corrosion shorting across the gap <\/td>\n<\/tr>\n | ||||||
| 21<\/td>\n | Figure 21 \u2013 Participant G and evidence of a water droplet and the resulting drop in SIR and dendrite like failure Figure 22 \u2013 Participant G and a corrosion defect probably from a flux residue Figure 23 \u2013 Participant C dendrites and corrosions formed on all SIR patternsof all fluxed samples tested at 85\u00b0C\/85% <\/td>\n<\/tr>\n | ||||||
| 22<\/td>\n | Figure 24 \u2013 The average final SIR value for the control boards Figure 25 \u2013 The average final SIR value for the flux loaded boards <\/td>\n<\/tr>\n | ||||||
| 23<\/td>\n | Figure 26 \u2013 The average final SIR for flux-loaded patterns by participant Figure 27 \u2013 Final SIR plotted as ohm.squares <\/td>\n<\/tr>\n | ||||||
| 24<\/td>\n | Figure 28 \u2013 Ratio of the log \u03a9.square value to the 500-\u00b5m pattern <\/td>\n<\/tr>\n | ||||||
| 25<\/td>\n | Bibliography <\/td>\n<\/tr>\n<\/table>\n","protected":false},"excerpt":{"rendered":" Test methods for electrical materials, printed boards and other interconnection structures and assemblies – General test methods for materials and assemblies. An intercomparison evaluation to implement the use of fine-pitch test structures for surface insulation resistance (SIR) testing of solder fluxes in accordance with IEC 61189-5-501<\/b><\/p>\n |