{"id":423760,"date":"2024-10-20T06:48:19","date_gmt":"2024-10-20T06:48:19","guid":{"rendered":"https:\/\/pdfstandards.shop\/product\/uncategorized\/bsi-pd-iec-tr-61000-1-12023\/"},"modified":"2024-10-26T12:46:31","modified_gmt":"2024-10-26T12:46:31","slug":"bsi-pd-iec-tr-61000-1-12023","status":"publish","type":"product","link":"https:\/\/pdfstandards.shop\/product\/publishers\/bsi\/bsi-pd-iec-tr-61000-1-12023\/","title":{"rendered":"BSI PD IEC TR 61000-1-1:2023"},"content":{"rendered":"
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2<\/td>\n | undefined <\/td>\n<\/tr>\n | ||||||
4<\/td>\n | CONTENTS <\/td>\n<\/tr>\n | ||||||
6<\/td>\n | FOREWORD <\/td>\n<\/tr>\n | ||||||
9<\/td>\n | 1 Scope 2 Normative references 3 Terms, definitions and abbreviated terms 3.1 Terms and definitions <\/td>\n<\/tr>\n | ||||||
12<\/td>\n | 3.2 Abbreviated terms 4 The electromagnetic environment 4.1 General <\/td>\n<\/tr>\n | ||||||
13<\/td>\n | 4.2 Coupling between emitting and susceptible devices Figures Figure 1 \u2013 Coupling paths between emitting and susceptible devices <\/td>\n<\/tr>\n | ||||||
14<\/td>\n | 5 Application of EMC terms and definitions 5.1 General 5.2 Relation between various types of levels 5.2.1 Emissions and immunity level (and limit) <\/td>\n<\/tr>\n | ||||||
15<\/td>\n | 5.2.2 Compatibility level Figure 2 \u2013 Limits and levels for a single emitter and susceptible deviceas a function of some independent variable (e.g., frequency) Figure 3 \u2013 Emission\/immunity limits and compatibility levels, with an example of emission\/immunity levels for a single emitter and susceptible device as a functionof some independent variable (e.g., frequency) <\/td>\n<\/tr>\n | ||||||
16<\/td>\n | 5.2.3 Examples to illustrate the concepts of using levels and limits <\/td>\n<\/tr>\n | ||||||
17<\/td>\n | Figure 4 \u2013 Compatibility levels Uc for the odd harmonics in a public low-voltage network and examples of associated emission and immunity limits <\/td>\n<\/tr>\n | ||||||
18<\/td>\n | 5.3 Probability aspects and margins 5.3.1 Compatibility levels and uncertainties <\/td>\n<\/tr>\n | ||||||
19<\/td>\n | 5.3.2 Standardized test Figure 5 \u2013 Limits, compatibility levels and margins, as a functionof any independent variable (e.g., frequency) <\/td>\n<\/tr>\n | ||||||
20<\/td>\n | 5.3.3 In situ test \u2013 Superposition Figure 6 \u2013 Example of the probability densities for an emission level andan immunity level, at one single value of the independent variable <\/td>\n<\/tr>\n | ||||||
22<\/td>\n | 5.3.4 Lack of data Figure 7 \u2013 Example of superposition of disturbances Figure 8 \u2013 Example of probability densities for an ultimate disturbance level(the sum of disturbance levels produced by various emitters) and the immunitylevels of two types of susceptible device <\/td>\n<\/tr>\n | ||||||
23<\/td>\n | 6 Models and their limitations 6.1 General 6.2 Source models 6.2.1 Conducted emissions <\/td>\n<\/tr>\n | ||||||
24<\/td>\n | 6.2.2 Radiated emissions Figure 9 \u2013 Source model for conducted emissions(source loaded by ZL1 and ZL2) <\/td>\n<\/tr>\n | ||||||
25<\/td>\n | 6.3 Coupling models 6.3.1 General 6.3.2 Common impedance coupling Figure 10 \u2013 Electric and magnetic dipole elements <\/td>\n<\/tr>\n | ||||||
26<\/td>\n | 6.3.3 Coupling by induction <\/td>\n<\/tr>\n | ||||||
27<\/td>\n | Figure 11 \u2013 Capacitance per unit length as a function of conductor separation <\/td>\n<\/tr>\n | ||||||
28<\/td>\n | Figure 12 \u2013 Flux density from parallel conductors <\/td>\n<\/tr>\n | ||||||
29<\/td>\n | 6.3.4 Radiative coupling 6.4 Susceptible device models <\/td>\n<\/tr>\n | ||||||
30<\/td>\n | Annex A (informative)Interpretation of EMC terms and definitions A.1 General A.2 Units and decibels <\/td>\n<\/tr>\n | ||||||
31<\/td>\n | A.3 Electromagnetic interference, compatibility and environment A.3.1 General A.3.2 Electromagnetic interference (EMI) Figure A.1 \u2013 The basic form of an EMI problem <\/td>\n<\/tr>\n | ||||||
32<\/td>\n | A.3.3 Electromagnetic compatibility (EMC) A.3.4 The electromagnetic environment Figure A.2 \u2013 Subdivision of EMC in its key aspects <\/td>\n<\/tr>\n | ||||||
33<\/td>\n | A.4 Susceptibility\/immunity A.5 Level and limit <\/td>\n<\/tr>\n | ||||||
34<\/td>\n | A.6 Emission and immunity <\/td>\n<\/tr>\n | ||||||
36<\/td>\n | A.7 Compatibility level and margin Figure A.3 \u2013 Overview of various EMC terms and measuring conditions <\/td>\n<\/tr>\n | ||||||
37<\/td>\n | Figure A.4 \u2013 Examples of probability densities p(D), p(I) and the resulting p(I \u2013 D) <\/td>\n<\/tr>\n | ||||||
39<\/td>\n | Annex B (informative)Standardized and in situ tests <\/td>\n<\/tr>\n | ||||||
40<\/td>\n | Annex C (informative)Review of the historical assignment of radiated disturbance degrees C.1 General C.2 Theoretical analysis of radiated disturbance degrees Table C.1 \u2013 Radiated disturbance degrees <\/td>\n<\/tr>\n | ||||||
41<\/td>\n | Figure C.1 \u2013 Problem geometry <\/td>\n<\/tr>\n | ||||||
42<\/td>\n | C.3 Detailed derivations C.3.1 Derivation of Formula (C.4) <\/td>\n<\/tr>\n | ||||||
43<\/td>\n | C.3.2 Derivation of Formula (C.5) <\/td>\n<\/tr>\n | ||||||
45<\/td>\n | Bibliography <\/td>\n<\/tr>\n<\/table>\n","protected":false},"excerpt":{"rendered":" Electromagnetic compatibility (EMC) – General. Application and interpretation of fundamental definitions and terms<\/b><\/p>\n |