{"id":81572,"date":"2024-10-17T18:56:06","date_gmt":"2024-10-17T18:56:06","guid":{"rendered":"https:\/\/pdfstandards.shop\/product\/uncategorized\/ieee-1671-4-2008\/"},"modified":"2024-10-24T19:47:12","modified_gmt":"2024-10-24T19:47:12","slug":"ieee-1671-4-2008","status":"publish","type":"product","link":"https:\/\/pdfstandards.shop\/product\/publishers\/ieee\/ieee-1671-4-2008\/","title":{"rendered":"IEEE 1671.4 2008"},"content":{"rendered":"

New IEEE Standard – Active. This document specifies an exchange format, utilizing XML, for identifying the test configuration used to test and diagnose a unit under test (UUT) on an automatic test system (ATS).<\/p>\n

PDF Catalog<\/h4>\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n
PDF Pages<\/th>\nPDF Title<\/th>\n<\/tr>\n
1<\/td>\nIEEE Std 1671.4-2007 Front Cover <\/td>\n<\/tr>\n
3<\/td>\nTitle Page <\/td>\n<\/tr>\n
6<\/td>\nIntroduction
Notice to users
Laws and regulations <\/td>\n<\/tr>\n
7<\/td>\nCopyrights
Updating of IEEE documents
Errata
Interpretations
Patents <\/td>\n<\/tr>\n
8<\/td>\nParticipants <\/td>\n<\/tr>\n
10<\/td>\nContents <\/td>\n<\/tr>\n
11<\/td>\nImportant Notice
1. Overview <\/td>\n<\/tr>\n
12<\/td>\n1.1 Scope
1.2 Purpose
1.3 Application
1.4 Conventions used within this document <\/td>\n<\/tr>\n
13<\/td>\n2. Normative references <\/td>\n<\/tr>\n
14<\/td>\n3. Definitions, acronyms, and abbreviations
3.1 Definitions <\/td>\n<\/tr>\n
15<\/td>\n3.2 Acronyms and abbreviations <\/td>\n<\/tr>\n
16<\/td>\n4. Schema\u2014TestConfiguration.xsd
4.1 General
4.2 Elements <\/td>\n<\/tr>\n
18<\/td>\n4.3 Child elements <\/td>\n<\/tr>\n
24<\/td>\n4.4 Complex types <\/td>\n<\/tr>\n
26<\/td>\n4.5 Inherited simple types
4.6 Inherited complex types <\/td>\n<\/tr>\n
27<\/td>\n4.7 Inherited attribute groups
5. Instance schema\u2014None
6. Conformance
7. Extensibility <\/td>\n<\/tr>\n
28<\/td>\nAnnex A (informative) TestConfiguration instance documents (.XML files) <\/td>\n<\/tr>\n
29<\/td>\nAnnex B (informative) Users information and examples <\/td>\n<\/tr>\n
31<\/td>\nAnnex C (informative) Glossary <\/td>\n<\/tr>\n
32<\/td>\nAnnex D (informative) Bibliography <\/td>\n<\/tr>\n<\/table>\n","protected":false},"excerpt":{"rendered":"

IEEE Standard for Automatic Test Markup Language (ATML) for Exchanging Automatic Test Information via eXtensible Markup Language (XML): Exchanging Test Configuration Information<\/b><\/p>\n\n\n\n\n
Published By<\/td>\nPublication Date<\/td>\nNumber of Pages<\/td>\n<\/tr>\n
IEEE<\/b><\/a><\/td>\n2008<\/td>\n34<\/td>\n<\/tr>\n<\/tbody>\n<\/table>\n","protected":false},"featured_media":81573,"template":"","meta":{"rank_math_lock_modified_date":false,"ep_exclude_from_search":false},"product_cat":[2644],"product_tag":[],"class_list":{"0":"post-81572","1":"product","2":"type-product","3":"status-publish","4":"has-post-thumbnail","6":"product_cat-ieee","8":"first","9":"instock","10":"sold-individually","11":"shipping-taxable","12":"purchasable","13":"product-type-simple"},"_links":{"self":[{"href":"https:\/\/pdfstandards.shop\/wp-json\/wp\/v2\/product\/81572","targetHints":{"allow":["GET"]}}],"collection":[{"href":"https:\/\/pdfstandards.shop\/wp-json\/wp\/v2\/product"}],"about":[{"href":"https:\/\/pdfstandards.shop\/wp-json\/wp\/v2\/types\/product"}],"wp:featuredmedia":[{"embeddable":true,"href":"https:\/\/pdfstandards.shop\/wp-json\/wp\/v2\/media\/81573"}],"wp:attachment":[{"href":"https:\/\/pdfstandards.shop\/wp-json\/wp\/v2\/media?parent=81572"}],"wp:term":[{"taxonomy":"product_cat","embeddable":true,"href":"https:\/\/pdfstandards.shop\/wp-json\/wp\/v2\/product_cat?post=81572"},{"taxonomy":"product_tag","embeddable":true,"href":"https:\/\/pdfstandards.shop\/wp-json\/wp\/v2\/product_tag?post=81572"}],"curies":[{"name":"wp","href":"https:\/\/api.w.org\/{rel}","templated":true}]}}