BS EN 61726:2015
$94.54
Cable assemblies, cables, connectors and passive microwave components — Screening attenuation measurement by the reverberation chamber method
| Published By | Publication Date | Number of Pages |
| BSI | 2015 | 22 |
IEC 61726:2015 describes the measurement of screening attenuation by the reverberation chamber test method, sometimes named mode stirred chamber, suitable for virtually any type of microwave component and having no theoretical upper frequency limit. It is only limited toward low frequencies due to the size of the test equipment, which is frequency-dependent and is only one of several methods of measuring screening attenuation. For the purpose of this standard, examples of microwave components are waveguides, phase shifters, diplexers/multiplexers, power dividers/combiners etc. This third edition cancels and replaces the second edition, published in 1999. This edition constitutes a technical revision. It takes into account the latest developments in the design of reverberation chambers as described in IEC 61000-4-21, which is also referencing this standard as a possible test method. Furthermore, an alternative measurement procedure is added which is able to reduce the measurement time needed.
PDF Catalog
| PDF Pages | PDF Title |
|---|---|
| 6 | CONTENTS |
| 7 | FOREWORD |
| 9 | 1 Scope 2 Normative references 3 Terms and definitions 4 Basic description of the reverberation chamber method |
| 10 | 5 Measurement of the screening attenuation of the device under test (DUT) 6 Description of the test set-up 6.1 Reverberation chamber |
| 11 | 6.2 Mode stirrer 6.3 Antennas 6.4 Test equipment 6.5 Device under test (DUT) Figures Figure 1 – Example of a test set-up |
| 12 | 6.6 Linking devices 7 Measurement procedure 7.1 General |
| 13 | 7.2 Measurement of the DUT 7.2.1 General 7.2.2 Standard measurement 7.2.3 Fast measurement |
| 14 | 7.3 Measurement of the insertion loss of the cavity 7.4 Control of the test set-up 7.4.1 Dynamic range |
| 15 | 7.4.2 Insertion loss of the chamber 7.4.3 Measurement of a calibrator 7.4.4 Measurement of lossy DUT 7.5 Revolution speed of the mode stirrer 7.6 Test frequencies |
| 16 | 7.7 Voltage standing wave ratio (VSWR) 8 Evaluation of the test results |
| 17 | Annex A (informative) Relationship between transfer impedance and screening attenuation |
| 18 | Annex B (informative) Example of a calibrator Figure B.1 – Basic construction details |
| 20 | Bibliography |
