BS ISO 15632:2002
$102.76
Microbeam analysis. Instrumental specification for energy dispersive X-ray spectrometers with semiconductor detectors
| Published By | Publication Date | Number of Pages |
| BSI | 2002 | 16 |
PDF Catalog
| PDF Pages | PDF Title |
|---|---|
| 3 | TitlePage – Microbeam analysis�— Instrumental specification for energy dispersive X-ray spectrome… |
| 5 | Foreword – Foreword |
| 6 | Introduction – Introduction |
| 7 | Scope – 1��� Scope |
| 8 | Clause1 – 3��� Requirements Subclause2 – 3.1��� General description Subclause2 – 3.2��� Energy resolution Subclause2 – 3.3��� Peak to background ratio Subclause2 – 3.4��� Energy dependence of instrumental detection efficiency |
| 9 | AnnexNormative – Measurement of line widths (FWHM) to determine the energy resolution of the�spec… Clause1 – A.1��� Specimens Clause1 – A.2��� Specimen preparation Clause1 – A.3��� Preparatory work Clause1 – A.4��� Measurement conditions Clause1 – A.5��� Background subtraction |
| 10 | Clause1 – A.6��� Calculation of FWHM Clause1 – A.7��� Example |
| 12 | AnnexNormative – Determination of the L/K ratio as a measure for the energy dependence of the�ins… Clause1 – B.1��� Specimens Clause1 – B.2��� Measurement conditions Clause1 – B.3��� Calculation of L/K ratio Clause1 – B.4��� Conversion of the L/K ratio for TOA |
| 14 | Bibliography – Bibliography |
