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BSI 18/30319114 DC:2018 Edition

BSI 18/30319114 DC:2018 Edition

$13.70

BS ISO 20171. Microbeam analysis. Scanning electron microscopy. Tagged image file format for Scanning electron microscopy(TIFF/SEM)

Published By Publication Date Number of Pages
BSI 2018 46
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Status

Definitive
Pages

46
Publication Date

2018-06-08
Standard Number

18/30319114 DC
Title

BS ISO 20171. Microbeam analysis. Scanning electron microscopy. Tagged image file format for Scanning electron microscopy(TIFF/SEM)
Identical National Standard Of

ISO 20171, ISO/DIS 20171
Descriptors

Electron beams, Magnification, Microscopes, Control samples, Electron optics, Calibration, Optical phenomena, Accuracy, Electron microscopes, Scanning electron microscopes, Optical instruments
Publisher

BSI
Committee

CII/9
ICS Codes 35.240.70 - IT applications in science
BSI 18/30319114 DC
$13.70