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BSI PD ISO/TS 17915:2013

$167.15

Optics and photonics. Measurement method of semiconductor lasers for sensing

Published By Publication Date Number of Pages
BSI 2013 36
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PDF Catalog

PDF Pages PDF Title
6 Foreword
7 Section sec_1
Section sec_2
Section sec_3
Section sec_3.1
Section sec_3.2
Section sec_3.2.1
1 Scope
2 Normative references
3 Optical sensing using semiconductor lasers
3.1 General
3.2 Semiconductor laser
8 Section sec_3.2.2
Section sec_3.2.3
Section sec_3.2.4
Section sec_3.2.5
9 Section sec_3.3
Section sec_3.3.1
Section sec_3.3.2
Table tab_a
Figure fig_1
Section sec_3.3.3
3.3 Common sensing technique and equipment using semiconductor laser
10 Table tab_b
Figure fig_2
Section sec_3.3.4
11 Table tab_c
Figure fig_3
Section sec_3.4
3.4 Temperature and current dependence of wavelength
12 Table tab_d
Figure fig_4
Table tab_e
Figure fig_5__a
13 Table tab_f
Figure fig_5__b
Section sec_3.5
3.5 Effect of current injection on lasing wavelength
14 Table tab_g
Figure fig_6
Section sec_3.6
3.6 Effect of ambient temperature on lasing wavelength
15 Table tab_h
Figure fig_7
Section sec_4
Section sec_4.1
Section sec_4.2
4 Measurement method for temperature dependence of wavelength
4.1 General
4.2 Description of measurement setup and requirements
16 Table tab_i
Figure fig_8
Section sec_4.3
4.3 Precautions to be observed
17 Section sec_4.4
Section sec_5
Section sec_5.1
Section sec_5.2
4.4 Measurement procedures
5 Measurement method for current dependence of wavelength
5.1 General
5.2 Description of measurement setup and requirements
18 Table tab_j
Figure fig_9
Section sec_5.3
5.3 Precautions to be observed
19 Section sec_5.4
Section sec_5.4.1
Section sec_5.4.2
Section sec_6
Section sec_6.1
5.4 Measurement procedures
6 Measurement method of spectral line width
6.1 General
20 Section sec_6.2
Table tab_k
Figure fig_10__a
6.2 Description of measurement setup and requirements
21 Table tab_l
Figure fig_10__b
22 Table tab_m
Figure fig_10__c
23 Section sec_6.3
Section sec_6.4
Section sec_6.4.1
Section sec_6.4.2
6.3 Precautions to be observed
6.4 Measurement procedures
25 Annex sec_A
Annex sec_A.1
Annex sec_A.2
Table tab_A.1
Annex A
(informative)

Essential ratings and characteristics

26 Annex sec_A.3
Annex sec_A.3.1
Annex sec_A.3.2
Annex sec_A.3.3
Annex sec_A.3.4
Annex sec_A.3.4.1
Annex sec_A.3.4.2
Annex sec_A.3.4.3
27 Annex sec_A.3.5
Table tab_A.2
Annex sec_A.3.6
Table tab_A.3
29 Annex sec_A.3.7
Annex sec_A.4
Annex sec_A.4.1
Annex sec_A.4.2
Annex sec_A.4.2.1
Annex sec_A.4.2.2
Annex sec_A.4.3
Annex sec_A.4.4
Annex sec_A.4.4.1
Annex sec_A.4.4.2
Annex sec_A.4.4.3
Annex sec_A.4.4.4
Annex sec_A.4.4.5
30 Annex sec_A.4.5
Table tab_A.4
Annex sec_A.4.6
Table tab_A.5
32 Annex sec_A.4.7
33 Reference ref_1
Reference ref_2
Reference ref_3
Reference ref_4
Reference ref_5
Reference ref_6
Bibliography
BSI PD ISO/TS 17915:2013
$167.15