IEEE 993-1997
$85.58
IEEE Standard for Test Equipment Description Language (TEDL)
| Published By | Publication Date | Number of Pages |
| IEEE | 1997 |
Revision Standard – Inactive-Withdrawn. A language useful for describing Automatic Test Equipment (ATE) instrumentation and configurations, as well as Interface Test Adapters (ITA), is defined. Principally intended for testing environments using the ATLAS test language, TEDL can also be used to describe instrumentation in non-ATLAS environments.
PDF Catalog
| PDF Pages | PDF Title |
|---|---|
| 1 | Title page |
| 3 | Introduction |
| 4 | Participants |
| 6 | CONTENTS |
| 8 | 1. Overview 1.1 Scope 1.2 Purpose 1.3 Application |
| 9 | 1.4 Relationship to other documents 2. References |
| 10 | 3. Terminology 3.1 Definitions |
| 11 | 3.2 Acronyms 3.3 TEDL reserved words |
| 17 | 4. TEDL overview 4.1 TEDL objectives 4.2 TEDL description |
| 22 | 5. Interface to the ATLAS test program 5.1 Introduction 5.2 ATLAS-to-TEDL correspondence 5.3 Extensibility 5.4 Examples |
| 26 | 6. Adaptation model (AM) 6.1 General description 6.2 Relationship to other models 6.3 Adaptation model language (AML) |
| 28 | 6.4 AML rules |
| 29 | 7. Configuration model (CM) 7.1 General description 7.2 Relationship to other models 7.3 Configuration model language (CML) |
| 30 | 7.4 CML rules |
| 31 | 8. Device model (DM) 8.1 General description 8.2 Relationship to other models 8.3 Device model language (DML) |
| 33 | 8.4 DML rules |
| 34 | Annex AāComplete formal syntax of TEDL |
| 62 | Annex BāExamples |
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