{"id":250456,"date":"2024-10-19T16:31:20","date_gmt":"2024-10-19T16:31:20","guid":{"rendered":"https:\/\/pdfstandards.shop\/product\/uncategorized\/bs-en-iec-61788-72020\/"},"modified":"2024-10-25T11:44:54","modified_gmt":"2024-10-25T11:44:54","slug":"bs-en-iec-61788-72020","status":"publish","type":"product","link":"https:\/\/pdfstandards.shop\/product\/publishers\/bsi\/bs-en-iec-61788-72020\/","title":{"rendered":"BS EN IEC 61788-7:2020"},"content":{"rendered":"

IEC 61788-7:2020 is available as IEC 61788-7:2020 RLV<\/span> which contains the International Standard and its Redline version, showing all changes of the technical content compared to the previous edition.IEC 61788-7:2020 describes measurement of the surface resistance (Rs) of superconductors at microwave frequencies by the standard two-resonator method. The object of measurement is the temperature dependence of Rs at the resonant frequency. The applicable measurement range of Rs for this method is as follows: – Frequency: 8 GHz < f < 30 GHz – Measurement resolution: 0,01 m ? at 10 GHz The Rs data at the measured frequency, and that scaled to 10 GHz, assuming the f 2 rule for comparison, is reported. This third edition cancels and replaces the second edition, published in 2006. This edition constitutes a technical revision. This edition includes the following significant technical changes with respect to the previous edition: a) informative Annex B, relative combined standard uncertainty for surface resistance measurement has been added; b) precision and accuracy statements have been converted to uncertainty; c) reproducibility in surface resistant measurement has been added.<\/p>\n

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2<\/td>\nundefined <\/td>\n<\/tr>\n
5<\/td>\nAnnex ZA(normative)Normative references to international publicationswith their corresponding European publications <\/td>\n<\/tr>\n
7<\/td>\nEnglish
CONTENTS <\/td>\n<\/tr>\n
10<\/td>\nFOREWORD <\/td>\n<\/tr>\n
12<\/td>\nINTRODUCTION <\/td>\n<\/tr>\n
13<\/td>\n1 Scope
2 Normative references
3 Terms and definitions
4 Requirements <\/td>\n<\/tr>\n
14<\/td>\n5 Apparatus
5.1 Measurement system
Figure 1 \u2013 Schematic diagram of measurement system for temperature dependence of Rs using a cryocooler <\/td>\n<\/tr>\n
15<\/td>\n5.2 Measurement apparatus for Rs
Figures <\/td>\n<\/tr>\n
16<\/td>\nFigure 2 \u2013 Typical measurement apparatus for Rs <\/td>\n<\/tr>\n
17<\/td>\n5.3 Dielectric rods
6 Measurement procedure
6.1 Specimen preparation
Table 1 \u2013 Typical dimensions of pairs of single-crystal sapphire rods for 12 GHz, 18 GHz and 22 GHz <\/td>\n<\/tr>\n
18<\/td>\n6.2 Set-up
6.3 Measurement of reference level
Tables
Table 2 \u2013 Dimensions of superconductor film for 12 GHz, 18 GHz, and 22 GHz <\/td>\n<\/tr>\n
19<\/td>\n6.4 Measurement of the frequency response of resonators
Figure 3 \u2013 Insertion attenuation, IA, resonant frequency, f0, and half power bandwidth, \u0394f, measured at T kelvin <\/td>\n<\/tr>\n
21<\/td>\n6.5 Determination of surface resistance of the superconductor and \u03b5\u2032 and tan \u03b4 of the standard sapphire rods
Figure 4 \u2013 Reflection scattering parameters (S11 and S22) <\/td>\n<\/tr>\n
22<\/td>\n7 Uncertainty of the test method
7.1 Surface resistance
Table 3 \u2013 Specifications for vector network analyzer
Table 4 \u2013 Specifications for sapphire rods <\/td>\n<\/tr>\n
23<\/td>\n7.2 Temperature
7.3 Specimen and holder support structure
Figure 5 \u2013 Term definitions in Table 4 <\/td>\n<\/tr>\n
24<\/td>\n7.4 Specimen protection
7.5 Uncertainty of surface resistance measured by standard two-resonator method
8 Test report
8.1 Identification of test specimen
8.2 Report of Rs values
8.3 Report of test conditions <\/td>\n<\/tr>\n
25<\/td>\nAnnex A (informative) Additional information relating to Clauses 1 to 8
A.1 Scope
A.1.1 General
A.1.2 Cylindrical cavity method [10] [17]
A.1.3 Parallel-plates resonator method [18] [19]
A.1.4 Microstrip-line resonance method [20] [21]
A.1.5 Dielectric resonator method [22] [23] [24] [25] <\/td>\n<\/tr>\n
26<\/td>\nA.1.6 Image-type dielectric resonator method [26] [27]
Figure A.1 \u2013 Schematic configuration of several measurement methods for the surface resistance <\/td>\n<\/tr>\n
27<\/td>\nA.1.7 Two-resonator method [28] [29]
A.2 Requirements
A.3 Theory and calculation equations <\/td>\n<\/tr>\n
28<\/td>\nFigure A.2 \u2013 Configuration of a cylindrical dielectric rod resonator short-circuited at both ends by two parallel superconductor films deposited on dielectric substrates <\/td>\n<\/tr>\n
29<\/td>\nFigure A.3 \u2013 Computed results of the u-v and W-v relations for TE01p mode <\/td>\n<\/tr>\n
30<\/td>\nA.4 Apparatus
Figure A.4 \u2013 Configuration of standard dielectric rods for measurement of Rs and tan \u03b4 <\/td>\n<\/tr>\n
31<\/td>\nA.5 Dimensions of the standard sapphire rods
Figure A.5 \u2013 Three types of dielectric resonators <\/td>\n<\/tr>\n
32<\/td>\nFigure A.6 \u2013 Mode chart to design TE011 resonator short-circuited at both ends by parallel superconductor films [28] <\/td>\n<\/tr>\n
33<\/td>\nA.6 Dimension of the closed type resonator
Figure A.7 \u2013 Mode chart to design TE013 resonator short-circuited at both ends by parallel superconductor films [28] <\/td>\n<\/tr>\n
34<\/td>\nFigure A.8 \u2013 Mode chart for TE011 closed-type resonator [28] <\/td>\n<\/tr>\n
35<\/td>\nA.7 Sapphire rod reproducibility
A.8 Test results
Figure A.9 \u2013 Mode chart for TE013 closed-type resonator [28] <\/td>\n<\/tr>\n
36<\/td>\nA.9 Reproducibility of measurement method
Figure A.10 \u2013 Temperature-dependent Rs of YBCO film with a thickness of 500 nm and size of 25 mm square <\/td>\n<\/tr>\n
37<\/td>\nA.10 tan \u03b4 deviation effect of sapphire rods on surface resistance
Figure A.11 \u2013 Temperature dependent Rs of YBCO film when Rs was measured three times
Table A.1 \u2013 Standard deviation of the surface resistance calculated from the results of Figure A.11 <\/td>\n<\/tr>\n
38<\/td>\nTable A.2 \u2013 Relationship between x, defined by Equation (A.12), and y, defined by Equation (A.13) <\/td>\n<\/tr>\n
39<\/td>\nAnnex B (informative) Evaluation of relative combined standard uncertainty for surface resistance measurement
B.1 Practical surface resistance measurement
Figure B.1 \u2013 Schematic diagram of TE011 and TE013 mode resonance <\/td>\n<\/tr>\n
40<\/td>\nB.2 Determination of surface resistance of the superconductor
Figure B.2 \u2013 Typical frequency characteristics of TE011 mode resonance <\/td>\n<\/tr>\n
41<\/td>\nB.3 Combined standard uncertainty
B.3.1 General
B.3.2 Calculation of c2 to c5 (12 GHz resonance at 20 K) <\/td>\n<\/tr>\n
42<\/td>\nB.3.3 Determination of u1 to u5 <\/td>\n<\/tr>\n
44<\/td>\nB.3.4 Combined relative standard uncertainty
Figure B.3 \u2013 Frequency characteristics of a resonator approximated by a Lorentz distribution <\/td>\n<\/tr>\n
46<\/td>\nBibliography <\/td>\n<\/tr>\n<\/table>\n","protected":false},"excerpt":{"rendered":"

Superconductivity – Electronic characteristic measurements. Surface resistance of high-temperature superconductors at microwave frequencies<\/b><\/p>\n\n\n\n\n
Published By<\/td>\nPublication Date<\/td>\nNumber of Pages<\/td>\n<\/tr>\n
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