{"id":340903,"date":"2024-10-19T23:53:30","date_gmt":"2024-10-19T23:53:30","guid":{"rendered":"https:\/\/pdfstandards.shop\/product\/uncategorized\/bsi-pd-iso-ts-179152013\/"},"modified":"2024-10-25T23:04:24","modified_gmt":"2024-10-25T23:04:24","slug":"bsi-pd-iso-ts-179152013","status":"publish","type":"product","link":"https:\/\/pdfstandards.shop\/product\/publishers\/bsi\/bsi-pd-iso-ts-179152013\/","title":{"rendered":"BSI PD ISO\/TS 17915:2013"},"content":{"rendered":"
PDF Pages<\/th>\n | PDF Title<\/th>\n<\/tr>\n | ||||||
---|---|---|---|---|---|---|---|
6<\/td>\n | Foreword <\/td>\n<\/tr>\n | ||||||
7<\/td>\n | Section sec_1 Section sec_2 Section sec_3 Section sec_3.1 Section sec_3.2 Section sec_3.2.1 1\tScope 2\tNormative references 3\tOptical sensing using semiconductor lasers 3.1\tGeneral 3.2\tSemiconductor laser <\/td>\n<\/tr>\n | ||||||
8<\/td>\n | Section sec_3.2.2 Section sec_3.2.3 Section sec_3.2.4 Section sec_3.2.5 <\/td>\n<\/tr>\n | ||||||
9<\/td>\n | Section sec_3.3 Section sec_3.3.1 Section sec_3.3.2 Table tab_a Figure fig_1 Section sec_3.3.3 3.3\tCommon sensing technique and equipment using semiconductor laser <\/td>\n<\/tr>\n | ||||||
10<\/td>\n | Table tab_b Figure fig_2 Section sec_3.3.4 <\/td>\n<\/tr>\n | ||||||
11<\/td>\n | Table tab_c Figure fig_3 Section sec_3.4 3.4\tTemperature and current dependence of wavelength <\/td>\n<\/tr>\n | ||||||
12<\/td>\n | Table tab_d Figure fig_4 Table tab_e Figure fig_5__a <\/td>\n<\/tr>\n | ||||||
13<\/td>\n | Table tab_f Figure fig_5__b Section sec_3.5 3.5\tEffect of current injection on lasing wavelength <\/td>\n<\/tr>\n | ||||||
14<\/td>\n | Table tab_g Figure fig_6 Section sec_3.6 3.6\tEffect of ambient temperature on lasing wavelength <\/td>\n<\/tr>\n | ||||||
15<\/td>\n | Table tab_h Figure fig_7 Section sec_4 Section sec_4.1 Section sec_4.2 4\tMeasurement method for temperature dependence of wavelength 4.1\tGeneral 4.2\tDescription of measurement setup and requirements <\/td>\n<\/tr>\n | ||||||
16<\/td>\n | Table tab_i Figure fig_8 Section sec_4.3 4.3\tPrecautions to be observed <\/td>\n<\/tr>\n | ||||||
17<\/td>\n | Section sec_4.4 Section sec_5 Section sec_5.1 Section sec_5.2 4.4\tMeasurement procedures 5\tMeasurement method for current dependence of wavelength 5.1\tGeneral 5.2\tDescription of measurement setup and requirements <\/td>\n<\/tr>\n | ||||||
18<\/td>\n | Table tab_j Figure fig_9 Section sec_5.3 5.3\tPrecautions to be observed <\/td>\n<\/tr>\n | ||||||
19<\/td>\n | Section sec_5.4 Section sec_5.4.1 Section sec_5.4.2 Section sec_6 Section sec_6.1 5.4\tMeasurement procedures 6\tMeasurement method of spectral line width 6.1\tGeneral <\/td>\n<\/tr>\n | ||||||
20<\/td>\n | Section sec_6.2 Table tab_k Figure fig_10__a 6.2\tDescription of measurement setup and requirements <\/td>\n<\/tr>\n | ||||||
21<\/td>\n | Table tab_l Figure fig_10__b <\/td>\n<\/tr>\n | ||||||
22<\/td>\n | Table tab_m Figure fig_10__c <\/td>\n<\/tr>\n | ||||||
23<\/td>\n | Section sec_6.3 Section sec_6.4 Section sec_6.4.1 Section sec_6.4.2 6.3\tPrecautions to be observed 6.4\tMeasurement procedures <\/td>\n<\/tr>\n | ||||||
25<\/td>\n | Annex sec_A Annex sec_A.1 Annex sec_A.2 Table tab_A.1 Annex\u00a0A \n(informative)<\/p>\n Essential ratings and characteristics <\/td>\n<\/tr>\n | ||||||
26<\/td>\n | Annex sec_A.3 Annex sec_A.3.1 Annex sec_A.3.2 Annex sec_A.3.3 Annex sec_A.3.4 Annex sec_A.3.4.1 Annex sec_A.3.4.2 Annex sec_A.3.4.3 <\/td>\n<\/tr>\n | ||||||
27<\/td>\n | Annex sec_A.3.5 Table tab_A.2 Annex sec_A.3.6 Table tab_A.3 <\/td>\n<\/tr>\n | ||||||
29<\/td>\n | Annex sec_A.3.7 Annex sec_A.4 Annex sec_A.4.1 Annex sec_A.4.2 Annex sec_A.4.2.1 Annex sec_A.4.2.2 Annex sec_A.4.3 Annex sec_A.4.4 Annex sec_A.4.4.1 Annex sec_A.4.4.2 Annex sec_A.4.4.3 Annex sec_A.4.4.4 Annex sec_A.4.4.5 <\/td>\n<\/tr>\n | ||||||
30<\/td>\n | Annex sec_A.4.5 Table tab_A.4 Annex sec_A.4.6 Table tab_A.5 <\/td>\n<\/tr>\n | ||||||
32<\/td>\n | Annex sec_A.4.7 <\/td>\n<\/tr>\n | ||||||
33<\/td>\n | Reference ref_1 Reference ref_2 Reference ref_3 Reference ref_4 Reference ref_5 Reference ref_6 Bibliography <\/td>\n<\/tr>\n<\/table>\n","protected":false},"excerpt":{"rendered":" Optics and photonics. Measurement method of semiconductor lasers for sensing<\/b><\/p>\n |