{"id":402184,"date":"2024-10-20T04:59:58","date_gmt":"2024-10-20T04:59:58","guid":{"rendered":"https:\/\/pdfstandards.shop\/product\/uncategorized\/bs-iec-60747-5-152022\/"},"modified":"2024-10-26T08:52:30","modified_gmt":"2024-10-26T08:52:30","slug":"bs-iec-60747-5-152022","status":"publish","type":"product","link":"https:\/\/pdfstandards.shop\/product\/publishers\/bsi\/bs-iec-60747-5-152022\/","title":{"rendered":"BS IEC 60747-5-15:2022"},"content":{"rendered":"

PDF Catalog<\/h4>\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n
PDF Pages<\/th>\nPDF Title<\/th>\n<\/tr>\n
2<\/td>\nundefined <\/td>\n<\/tr>\n
4<\/td>\nCONTENTS <\/td>\n<\/tr>\n
5<\/td>\nFOREWORD <\/td>\n<\/tr>\n
7<\/td>\n1 Scope
2 Normative references
3 Terms, definitions and abbreviated terms
3.1 Terms and definitions <\/td>\n<\/tr>\n
8<\/td>\n3.2 Abbreviated terms
4 Measuring methods
4.1 Basic requirements
4.1.1 Measuring conditions
4.1.2 Measuring instruments and equipment
4.2 Purpose <\/td>\n<\/tr>\n
9<\/td>\n4.3 Measurement
4.3.1 Measurement setup
4.3.2 Measurement principle
Figures
Figure 1 \u2013 Schematic diagram of the ER setup <\/td>\n<\/tr>\n
10<\/td>\nFigure 2 \u2013 Schematic illustration of the quantum welland the ER signal under different voltages <\/td>\n<\/tr>\n
11<\/td>\n4.3.3 Measurement sequence
5 Test report
Figure 3 \u2013 Sequence of the measurement of the flat-band voltage <\/td>\n<\/tr>\n
12<\/td>\nAnnex A (informative)Test example
Figure A.1 \u2013 \u0394R\/R versus wavelength at different bias voltages <\/td>\n<\/tr>\n
13<\/td>\nFigure A.2 \u2013 ER peak as a function of reverse-bias voltage <\/td>\n<\/tr>\n
14<\/td>\nTable A.1 \u2013 Summary of test report <\/td>\n<\/tr>\n
15<\/td>\nAnnex B (informative)Background information
Figure B.1 \u2013 Schematic illustration of polarizations in the InGaN\/GaN materialsystem and resulting internal electric field <\/td>\n<\/tr>\n
16<\/td>\nBibliography <\/td>\n<\/tr>\n<\/table>\n","protected":false},"excerpt":{"rendered":"

Semiconductor devices – Optoelectronic devices. Light emitting diodes. Test method of the flat-band voltage based on the electroreflectance spectroscopy<\/b><\/p>\n\n\n\n\n
Published By<\/td>\nPublication Date<\/td>\nNumber of Pages<\/td>\n<\/tr>\n
BSI<\/b><\/a><\/td>\n2022<\/td>\n18<\/td>\n<\/tr>\n<\/tbody>\n<\/table>\n","protected":false},"featured_media":402193,"template":"","meta":{"rank_math_lock_modified_date":false,"ep_exclude_from_search":false},"product_cat":[2641],"product_tag":[],"class_list":{"0":"post-402184","1":"product","2":"type-product","3":"status-publish","4":"has-post-thumbnail","6":"product_cat-bsi","8":"first","9":"instock","10":"sold-individually","11":"shipping-taxable","12":"purchasable","13":"product-type-simple"},"_links":{"self":[{"href":"https:\/\/pdfstandards.shop\/wp-json\/wp\/v2\/product\/402184","targetHints":{"allow":["GET"]}}],"collection":[{"href":"https:\/\/pdfstandards.shop\/wp-json\/wp\/v2\/product"}],"about":[{"href":"https:\/\/pdfstandards.shop\/wp-json\/wp\/v2\/types\/product"}],"wp:featuredmedia":[{"embeddable":true,"href":"https:\/\/pdfstandards.shop\/wp-json\/wp\/v2\/media\/402193"}],"wp:attachment":[{"href":"https:\/\/pdfstandards.shop\/wp-json\/wp\/v2\/media?parent=402184"}],"wp:term":[{"taxonomy":"product_cat","embeddable":true,"href":"https:\/\/pdfstandards.shop\/wp-json\/wp\/v2\/product_cat?post=402184"},{"taxonomy":"product_tag","embeddable":true,"href":"https:\/\/pdfstandards.shop\/wp-json\/wp\/v2\/product_tag?post=402184"}],"curies":[{"name":"wp","href":"https:\/\/api.w.org\/{rel}","templated":true}]}}