{"id":453489,"date":"2024-10-20T09:30:31","date_gmt":"2024-10-20T09:30:31","guid":{"rendered":"https:\/\/pdfstandards.shop\/product\/uncategorized\/bs-iec-62715-6-222023\/"},"modified":"2024-10-26T17:38:19","modified_gmt":"2024-10-26T17:38:19","slug":"bs-iec-62715-6-222023","status":"publish","type":"product","link":"https:\/\/pdfstandards.shop\/product\/publishers\/bsi\/bs-iec-62715-6-222023\/","title":{"rendered":"BS IEC 62715-6-22:2023"},"content":{"rendered":"
PDF Pages<\/th>\n | PDF Title<\/th>\n<\/tr>\n | ||||||
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2<\/td>\n | undefined <\/td>\n<\/tr>\n | ||||||
4<\/td>\n | CONTENTS <\/td>\n<\/tr>\n | ||||||
6<\/td>\n | FOREWORD <\/td>\n<\/tr>\n | ||||||
8<\/td>\n | INTRODUCTION <\/td>\n<\/tr>\n | ||||||
9<\/td>\n | 1 Scope 2 Normative references <\/td>\n<\/tr>\n | ||||||
10<\/td>\n | 3 Terms, definitions and abbreviated terms 3.1 Terms and definitions 3.2 Abbreviated terms 4 Standard atmospheric conditions <\/td>\n<\/tr>\n | ||||||
11<\/td>\n | 5 Preparation of specimen for measurement 5.1 General 5.2 Visual examination 5.3 Specimen preparation <\/td>\n<\/tr>\n | ||||||
12<\/td>\n | Figures Figure 1 \u2013 Step 1: Preparing the components of the specimen Figure 2 \u2013 Step 2: Turning the back of the panel to face upward Figure 3 \u2013 Step 3: Turning over the base plate and attaching it to the back of the panel <\/td>\n<\/tr>\n | ||||||
13<\/td>\n | Figure 4 \u2013 Step 4: Turning over the base plate with the panel attached Tables Table 1 \u2013 Example of specimen preparation condition <\/td>\n<\/tr>\n | ||||||
14<\/td>\n | 5.4 Measurement location 5.4.1 General 5.4.2 Crease 5.4.3 Waviness 6 Measurement methods 6.1 General Figure 5 \u2013 Example of measuring area <\/td>\n<\/tr>\n | ||||||
15<\/td>\n | 6.2 Purpose 6.3 Non-contact topography 6.3.1 General 6.3.2 Test apparatus <\/td>\n<\/tr>\n | ||||||
16<\/td>\n | Figure 6 \u2013 Example of measurement system Figure 7 \u2013 Analysis flow chart for PMD <\/td>\n<\/tr>\n | ||||||
17<\/td>\n | Figure 8 \u2013 Surface normal vector N, sight ray of a camera p and reflected ray r <\/td>\n<\/tr>\n | ||||||
18<\/td>\n | Figure 9 \u2013 Osculating circle and curvature <\/td>\n<\/tr>\n | ||||||
19<\/td>\n | 6.3.3 Measurement procedure 6.3.4 Data analysis and report Figure 10 \u2013 Example of data distribution in the crease measuring area <\/td>\n<\/tr>\n | ||||||
20<\/td>\n | Figure 11 \u2013 Example of data grouping on the vertical direction with folding axis Figure 12 \u2013 Example of the Nth profile data <\/td>\n<\/tr>\n | ||||||
21<\/td>\n | Figure 13 \u2013 Example of data distribution in the waviness measuring area Table 2 \u2013 Example of crease data report using the PMD method <\/td>\n<\/tr>\n | ||||||
22<\/td>\n | 6.4 Non-contact profilometry 6.4.1 General Figure 14 \u2013 Concept of filtering profile Table 3 \u2013 Example of reporting waviness data <\/td>\n<\/tr>\n | ||||||
23<\/td>\n | 6.4.2 Test apparatus Figure 15 \u2013 Schematic of the result of laser scanning Figure 16 \u2013 Schematic diagram of the laser scanning apparatus <\/td>\n<\/tr>\n | ||||||
24<\/td>\n | 6.4.3 Measurement procedure Table 4 \u2013 Example of laser scanning apparatus condition <\/td>\n<\/tr>\n | ||||||
25<\/td>\n | 6.4.4 Data analysis and report Figure 17 \u2013 Example of position 1 and position 2 in the crease measuring area <\/td>\n<\/tr>\n | ||||||
26<\/td>\n | 6.5 Contact profilometry 6.5.1 General 6.5.2 Test apparatus Figure 18 \u2013 Schematic diagram of the contact profilometry apparatus Table 5 \u2013 Example of reporting crease data by the laser scanning method <\/td>\n<\/tr>\n | ||||||
27<\/td>\n | Figure 19 \u2013 Schematic diagram of the motion of probe Table 6 \u2013 Example of stylus condition <\/td>\n<\/tr>\n | ||||||
28<\/td>\n | 6.5.3 Measurement procedures 6.5.4 Data analysis and report <\/td>\n<\/tr>\n | ||||||
29<\/td>\n | Bibliography <\/td>\n<\/tr>\n<\/table>\n","protected":false},"excerpt":{"rendered":" Flexible display devices – Crease and waviness measurement methods<\/b><\/p>\n |