{"id":291538,"date":"2024-10-19T19:47:45","date_gmt":"2024-10-19T19:47:45","guid":{"rendered":"https:\/\/pdfstandards.shop\/product\/uncategorized\/bs-iso-254982018-tc\/"},"modified":"2024-10-25T16:50:20","modified_gmt":"2024-10-25T16:50:20","slug":"bs-iso-254982018-tc","status":"publish","type":"product","link":"https:\/\/pdfstandards.shop\/product\/publishers\/bsi\/bs-iso-254982018-tc\/","title":{"rendered":"BS ISO 25498:2018 – TC"},"content":{"rendered":"
PDF Pages<\/th>\n | PDF Title<\/th>\n<\/tr>\n | ||||||
---|---|---|---|---|---|---|---|
70<\/td>\n | undefined <\/td>\n<\/tr>\n | ||||||
74<\/td>\n | Foreword <\/td>\n<\/tr>\n | ||||||
76<\/td>\n | Introduction <\/td>\n<\/tr>\n | ||||||
77<\/td>\n | 1 Scope 2 Normative references 3 Terms and definitions <\/td>\n<\/tr>\n | ||||||
79<\/td>\n | 4 Principle 4.1 General 4.2 Spot diffraction pattern <\/td>\n<\/tr>\n | ||||||
82<\/td>\n | 4.3 Kikuchi pattern <\/td>\n<\/tr>\n | ||||||
83<\/td>\n | 4.4 Polycrystalline specimen 5 Reference materials <\/td>\n<\/tr>\n | ||||||
84<\/td>\n | 6 Equipment 7 Specimens 8 Experimental procedure 8.1 Instrument preparation <\/td>\n<\/tr>\n | ||||||
85<\/td>\n | 8.2 Procedure for acquirement of selected area electron diffraction patterns <\/td>\n<\/tr>\n | ||||||
88<\/td>\n | 8.3 Determination of diffraction constant, L\u03bb <\/td>\n<\/tr>\n | ||||||
89<\/td>\n | 9 Measurement and solution of the SAED patterns 9.1 Selection of the basic parallelogram <\/td>\n<\/tr>\n | ||||||
91<\/td>\n | 9.2 Indexing diffraction spots <\/td>\n<\/tr>\n | ||||||
92<\/td>\n | 10 180\u00b0 ambiguity 11 Uncertainty estimation 11.1 Factors affecting accuracy <\/td>\n<\/tr>\n | ||||||
93<\/td>\n | 11.2 Calibration with a reference material <\/td>\n<\/tr>\n | ||||||
94<\/td>\n | Annex A (informative) Interplanar spacing <\/td>\n<\/tr>\n | ||||||
95<\/td>\n | Annex B (informative) Spot diffraction patterns of single crystals for BCC, FCC and HCP structure[7] <\/td>\n<\/tr>\n | ||||||
114<\/td>\n | Bibliography <\/td>\n<\/tr>\n<\/table>\n","protected":false},"excerpt":{"rendered":" Tracked Changes. Microbeam analysis. Analytical electron microscopy. Selected area electron diffraction analysis using a transmission electron microscope<\/b><\/p>\n |